Wave optical simulation of the light trapping properties of black silicon surface textures

Alexander Jürgen Bett, Johannes Eisenlohr, Oliver Höhn, Päivikki Repo, Hele Savin, Benedikt Bläsi, Jan Christoph Goldschmidt

Tutkimustuotos: LehtiartikkeliArticleScientificvertaisarvioitu

38 Sitaatiot (Scopus)
499 Lataukset (Pure)

Abstrakti

Due to their low reflectivity and effective light trapping properties black silicon nanostructured surfaces are promising front side structures for thin crystalline silicon solar cells. For further optimization of the light trapping effect, particularly in combination with rear side structures, it is necessary to simulate the optical properties of black silicon. Especially, the angular distribution of light in the silicon bulk after passage through the front side structure is relevant. In this paper, a rigorous coupled wave analysis of black silicon is presented, where the black silicon needle shaped structure is approximated by a randomized cone structure. The simulated absorptance agrees well with measurement data. Furthermore, the simulated angular light distribution within the silicon bulk shows that about 70% of the light can be subjected to internal reflection, highlighting the good light trapping properties.

AlkuperäiskieliEnglanti
SivutA434-A445
Sivumäärä12
JulkaisuOptics Express
Vuosikerta24
Numero6
DOI - pysyväislinkit
TilaJulkaistu - 21 maalisk. 2016
OKM-julkaisutyyppiA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

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