Unsupervised Segmentation of Surface Defects with Simple Texture Measures

J. Iivarinen

Unsupervised Segmentation of Surface Defects with Simple Texture Measures

J. Iivarinen

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Conference article in proceedings › Scientific › vertaisarvioitu

Alkuperäiskieli	Englanti
Otsikko	Workshop of Texture Analysis in Machine Vision, Oulu, Finland, June 14-15, 1999
Sivut	53-58
Tila	Julkaistu - 1999
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Tutkimusalat

local binary pattern
self-organizing map
texture analysis
unsupervised learning

Siteeraa tätä

@inproceedings{41b9c9ef66ff42438ee5c12ad34cc7e8,

title = "Unsupervised Segmentation of Surface Defects with Simple Texture Measures",

keywords = "local binary pattern, self-organizing map, texture analysis, unsupervised learning, local binary pattern, self-organizing map, texture analysis, unsupervised learning, local binary pattern, self-organizing map, texture analysis, unsupervised learning",

author = "J. Iivarinen",

year = "1999",

language = "English",

pages = "53--58",

booktitle = "Workshop of Texture Analysis in Machine Vision, Oulu, Finland, June 14-15, 1999",

}

TY - GEN

T1 - Unsupervised Segmentation of Surface Defects with Simple Texture Measures

AU - Iivarinen, J.

PY - 1999

Y1 - 1999

KW - local binary pattern

KW - self-organizing map

KW - texture analysis

KW - unsupervised learning

KW - local binary pattern

KW - self-organizing map

KW - texture analysis

KW - unsupervised learning

KW - local binary pattern

KW - self-organizing map

KW - texture analysis

KW - unsupervised learning

M3 - Conference article in proceedings

SP - 53

EP - 58

BT - Workshop of Texture Analysis in Machine Vision, Oulu, Finland, June 14-15, 1999

ER -