Two-level blackout probabilistic risk analysis: Application to a test system

P. Henneaux; F. Faghihi; P.E. Labeau; J.C. Maun; L Haarla

Two-level blackout probabilistic risk analysis: Application to a test system

P. Henneaux, F. Faghihi, P.E. Labeau, J.C. Maun, L Haarla

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Chapter › Scientific › vertaisarvioitu

4 Sitaatiot (Scopus)

Alkuperäiskieli	Englanti
Otsikko	Safety, Reliability and Risk Analysis: Beyond the Horizon
Toimittajat	R.D.J.M. Steenbergen, P.H.A.J.M van Gelder, S Miraglia, A.C.W.M. Vrouwenvelder
Julkaisupaikka	Amsterdam
Kustantaja	CRC Press
Sivut	2855-2863
ISBN (painettu)	9781138001237
Tila	Julkaistu - 2013
OKM-julkaisutyyppi	A3 Kirjan tai muun kokoomateoksen osa

Muut tiedostot ja linkit

http://student.ulb.ac.be/~phenneau/paperESREL2013.pdf

Siteeraa tätä

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Two-level blackout probabilistic risk analysis: Application to a test system. / Henneaux, P.; Faghihi, F.; Labeau, P.E. et al.
Safety, Reliability and Risk Analysis: Beyond the Horizon. toim. / R.D.J.M. Steenbergen; P.H.A.J.M van Gelder; S Miraglia; A.C.W.M. Vrouwenvelder. Amsterdam: CRC Press, 2013. s. 2855-2863.

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Chapter › Scientific › vertaisarvioitu

TY - CHAP

T1 - Two-level blackout probabilistic risk analysis: Application to a test system

AU - Henneaux, P.

AU - Faghihi, F.

AU - Labeau, P.E.

AU - Maun, J.C.

AU - Haarla, L

PY - 2013

Y1 - 2013

UR - http://student.ulb.ac.be/~phenneau/paperESREL2013.pdf

M3 - Chapter

SN - 9781138001237

SP - 2855

EP - 2863

BT - Safety, Reliability and Risk Analysis: Beyond the Horizon

A2 - Steenbergen, R.D.J.M.

A2 - van Gelder, P.H.A.J.M

A2 - Miraglia, S

A2 - Vrouwenvelder, A.C.W.M.

PB - CRC Press

CY - Amsterdam

ER -