Thermal Conductance of a Single-Electron Transistor

Tutkimustuotos: Lehtiartikkelivertaisarvioitu

Tutkijat

Organisaatiot

  • Université Grenoble Alpes
  • Skolkovo Institute of Science and Technology
  • Landau Institute for Theoretical Physics
  • Moscow Institute of Physics and Technology
  • Ulm University
  • University of Duisburg-Essen

Kuvaus

We report on combined measurements of heat and charge transport through a single-electron transistor. The device acts as a heat switch actuated by the voltage applied on the gate. The Wiedemann-Franz law for the ratio of heat and charge conductances is found to be systematically violated away from the charge degeneracy points. The observed deviation agrees well with the theoretical expectation. With a large temperature drop between the source and drain, the heat current away from degeneracy deviates from the standard quadratic dependence in the two temperatures.

Yksityiskohdat

AlkuperäiskieliEnglanti
Artikkeli077701
Sivut1-5
JulkaisuPhysical Review Letters
Vuosikerta119
Numero7
TilaJulkaistu - 15 elokuuta 2017
OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu

Lataa tilasto

Ei tietoja saatavilla

ID: 14994781