The reliability of microalloyed Sn-Ag-Cu solder interconnections under cyclic thermal and mechanical shock loading

Tutkimustuotos: Lehtiartikkeli

Tutkijat

Organisaatiot

Kuvaus

In this study, the performance of three microalloyed Sn-Ag-Cu solder interconnection compositions (Sn-3.1Ag-0.52Cu, Sn-3.0Ag-0.52Cu-0.24Bi, and Sn-1.1Ag-0.52Cu-0.1Ni) was compared under mechanical shock loading (JESD22-B111 standard) and cyclic thermal loading (40 ± 125°C, 42 min cycle) conditions. In the drop tests, the component boards with the low-silver nickel-containing composition (Sn-Ag-Cu-Ni) showed the highest average number of drops-to-failure, while those with the bismuth-containing alloy (Sn-Ag-Cu-Bi) showed the lowest. Results of the thermal cycling tests showed that boards with Sn-Ag-Cu-Bi interconnections performed the best, while those with Sn-Ag-Cu-Ni performed the worst. Sn-Ag-Cu was placed in the middle in both tests. In this paper, we demonstrate that solder strength is an essential reliability factor and that higher strength can be beneficial for thermal cycling reliability but detrimental to drop reliability. We discuss these findings from the perspective of the microstructures and mechanical properties of the three solder interconnection compositions and, based on a comprehensive literature review, investigate how the differences in the solder compositions influence the mechanical properties of the interconnections and discuss how the differences are reflected in the failure mechanisms under both loading conditions.

Yksityiskohdat

AlkuperäiskieliEnglanti
Sivut4090-4102
Sivumäärä13
JulkaisuJournal of Electronic Materials
Vuosikerta43
Numero11
TilaJulkaistu - 1 marraskuuta 2014
OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu

ID: 9310765