@techreport{2f929f02be5e4574b9fdb6d3a09fbf38,
title = "The Impact of Subsrate Quality on the Reliablity of SiC Photodiode Operation",
keywords = "silicon carbide, synchrotron x-ray topography, silicon carbide, synchrotron x-ray topography, silicon carbide, synchrotron x-ray topography",
author = "T. Tuomi and P.J McNally and L. {"}O'Reilly{"} and J. Riikonen and P. Bergman and H. Jacobson and C. Hallin",
year = "2004",
language = "English",
series = "HASYLAB Annual Report 2004",
type = "WorkingPaper",
}