TEM verification of optical diameter distribution analysis for nitrogen-doped SWCNT films

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Alkuperäiskieli	Englanti
Sivut	17-21
Julkaisu	Journal of Nanoelectronics and Optoelectronics
Vuosikerta	7
Numero	1
DOI - pysyväislinkit	https://doi.org/10.1166/jno.2012.1209
Tila	Julkaistu - 2012
OKM-julkaisutyyppi	A1 Julkaistu artikkeli, soviteltu

Siteeraa tätä

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title = "TEM verification of optical diameter distribution analysis for nitrogen-doped SWCNT films",

keywords = "tubes, tubes, tubes",

author = "T. Susi and Z. Zhu and Y. Tian and A.G. Nasibulin and H. Jiang and E.I. Kauppinen",

year = "2012",

doi = "10.1166/jno.2012.1209",

language = "English",

volume = "7",

pages = "17--21",

journal = "Journal of Nanoelectronics and Optoelectronics",

issn = "1555-130X",

publisher = "American Scientific Publishers",

number = "1",

}

TY - JOUR

T1 - TEM verification of optical diameter distribution analysis for nitrogen-doped SWCNT films

AU - Susi, T.

AU - Zhu, Z.

AU - Tian, Y.

AU - Nasibulin, A.G.

AU - Jiang, H.

AU - Kauppinen, E.I.

PY - 2012

Y1 - 2012

KW - tubes

UR - http://dx.doi.org/10.1166/jno.2012.1209

U2 - 10.1166/jno.2012.1209

DO - 10.1166/jno.2012.1209

M3 - Article

VL - 7

SP - 17

EP - 21

JO - Journal of Nanoelectronics and Optoelectronics

JF - Journal of Nanoelectronics and Optoelectronics

SN - 1555-130X

IS - 1

ER -