@article{2c1b9186987240719404f4d60bff6679,
title = "Synchrotron topography and X-ray diffraction study of GaInP layers grown on GaAs/Ge",
keywords = "indium gallium phosphide, synchrotron x-ray topography, x-ray diffraction, indium gallium phosphide, synchrotron x-ray topography, x-ray diffraction, indium gallium phosphide, synchrotron x-ray topography, x-ray diffraction",
author = "A. Lankinen and L. Knuuttila and P. Kostamo and T.O. Tuomi and H. Lipsanen and P.J. McNally and L. {"}O'Reilly{"}",
year = "2009",
month = nov,
day = "1",
doi = "10.1016/j.jcrysgro.2009.08.032",
language = "English",
volume = "311",
pages = "4619--4627",
journal = "Journal of Crystal Growth",
issn = "1873-5002",
publisher = "Elsevier",
number = "22",
}