Abstrakti
Developments in fabrication and control of nanoscale devices have made precise singleelectron counting possible. Due to the improved stability of these devices, increasing amounts of data can be collected leading to unprecedented statistics. These features have enabled the experimental verification of various statistical physics concepts, such as fluctuation relations and Maxwell's demon, with high precision.
The recent theory results on extreme fluctuations in the entropy produced by a system, and first passage times, have not yet been verified experimentally. The experimental studies of these theoretical concepts using singleelectron devices are the focus of this thesis. The thesis starts with a brief introduction to the physics of singleelectronic devices used in the experiments along with the experimental setup used to study them. Next, the experimental methods used to fabricate the samples and the basic sample characterization techniques are presented.
Later, the theoretical concepts are discussed and compared to the experimental results. This part starts with the probability distribution of the filtered telegraph signal from a bistable system, here a singleelectron transistor. The filtering is done in two different ways: low pass filtering and finite timeaveraging of the signal. The former allows us to propose a new method to obtain the transition rates between two states of the bistable system using the cumulants of its distribution. The latter allows us to see the rare fluctuations of current and observe theoretically predicted elliptic tail of the logarithm of the averaged current distribution.
Next, the stochastic entropy produced by a system is discussed. This part also includes the properties of its distribution and its minimum value. The theory is presented along with the experimental observations. Finally, an introduction to the theory of firstpassagetime distributions is provided.
Julkaisun otsikon käännös  Statistics of rare events in singleelectron devices 

Alkuperäiskieli  Englanti 
Pätevyys  Tohtorintutkinto 
Myöntävä instituutio 

Valvoja/neuvonantaja 

Kustantaja  
Painoksen ISBN  9789526084190 
Sähköinen ISBN  9789526084206 
Tila  Julkaistu  2019 
OKMjulkaisutyyppi  G5 Artikkeliväitöskirja 
Sormenjälki
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OtaNano – Kylmälaboratorio
Savin, A. (Manager) & Rissanen, A. (Other)
OtaNanoLaitteistot/tilat: Facility
