Stabilized Stroboscopic Full-Field Interferometer for Characterization of Subnanometer Surface Vibrations

Tutkimustuotos: Lehtiartikkelivertaisarvioitu

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The ongoing rapid development of digital camera technology together with increasing computing power enabling fast image analysis has opened up possibilities to further advance the performance of full-field interferometry. We present a software-based stabilization method for stroboscopic homodyne full-field interferometry that enables phase sensitive absolute-amplitude measurements of surface vibrations in microelectromechanical devices. The reference signal for the stabilization is obtained from a freely selectable region in the acquired interference images, resulting in a compact interferometer design without the need for additional optical components for monitoring the operation point. The proposed stabilization method is implemented in an LED-based stroboscopic Michelson-type full-field interferometer. To demonstrate the performance of the setup, an out-of-plane vibration field at 12 MHz in a square-plate silicon resonator is characterized. The data analysis reveals that a minimum detectable amplitude of less than 30 pm is achieved in the measurement. These first results already demonstrate the potential of the software-stabilization concept and serve to advance the detection of low-amplitude surface vibrations with full-field interferometry.

Yksityiskohdat

AlkuperäiskieliEnglanti
Artikkeli7113753
Sivut1642-1646
Sivumäärä5
JulkaisuJournal of Microelectromechanical Systems
Vuosikerta24
Numero5
TilaJulkaistu - 1 lokakuuta 2015
OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu

ID: 1739164