Abstrakti
Films of single-walled carbon nanotubes are promising for various electro-optical applications. Their engineering at the nanoscale requires a robust method of the contactless, non-invasive determination of structural properties. Here we present a study that uses specular reflectometry for this purpose, namely to determine the film thickness. Analysis of the reflection coefficient of neutrons, as well as X-rays, makes it possible to obtain a normal density profile and thereby trace the effect of densification of films of single-walled carbon nanotubes by ethanol drop casting. The paper summarizes the first experience of using combined neutron and X-ray approach in relation to low-density carbon films. Further steps for the development of the technique are discussed.
Alkuperäiskieli | Englanti |
---|---|
Sivut | 773-776 |
Sivumäärä | 4 |
Julkaisu | Journal of Surface Investigation |
Vuosikerta | 15 |
Numero | 4 |
DOI - pysyväislinkit | |
Tila | Julkaistu - heinäk. 2021 |
OKM-julkaisutyyppi | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä |