Abstrakti
Novel solar cell materials consisting of Si nanoparticles embedded in SiO2 layers have been studied using positron annihilation spectroscopy in Doppler broadening mode and photoluminescence. Two positron-trapping interface states are observed after high temperature annealing at 1100 °C. One of the states is attributed to the (SiO2/Si bulk) interface and the other to the interface between the Si nanoparticles and SiO2. A small reduction in positron trapping into these states is observed after annealing the samples in N2 atmosphere with 5% H2. Enhanced photoluminescence is also observed from the samples following this annealing step.
Alkuperäiskieli | Englanti |
---|---|
Artikkeli | 164316 |
Sivut | 1-4 |
Sivumäärä | 4 |
Julkaisu | Journal of Applied Physics |
Vuosikerta | 114 |
Numero | 16 |
DOI - pysyväislinkit | |
Tila | Julkaistu - 2013 |
OKM-julkaisutyyppi | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä |
Tutkimusalat
- nanoparticle
- positron
- silicon
- silicon dioxide
- solar cell