Setup for shot noise measurements in carbon nanotubes

Fan Wu; Leif Roschier; Taku Tsuneta; Mikko Paalanen; Taihong Wang; Pertti Hakonen

doi:10.1063/1.2355263

Setup for shot noise measurements in carbon nanotubes

Fan Wu
, Leif Roschier
, Taku Tsuneta
, Mikko Paalanen
, Taihong Wang
, Pertti Hakonen

Teknillisen fysiikan laitos

Chinese Academy of Sciences

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Conference article in proceedings › Scientific › vertaisarvioitu

16 Sitaatiot (Scopus)

Abstrakti

We have constructed a noise measurement setup for high impedance carbon nanotube samples. Our setup, working in the frequency range of 600 – 900 MHz, takes advantage of the fact that the shot noise power is reasonably large for high impedance sources so that relatively large, fixed non‐matching conditions can be tolerated.

Alkuperäiskieli	Englanti
Otsikko	24th International Conference on Low Temperature Physics, Orlando, Florida, USA, August 10-17.2005
Toimittajat	Y. et al. Takana
Kustantaja	American Institute of Physics
Sivut	1482-1483
Sivumäärä	2
ISBN (elektroninen)	0-7354-0348-1
ISBN (painettu)	0-7354-0347-3
DOI - pysyväislinkit	https://doi.org/10.1063/1.2355263
Tila	Julkaistu - 2006
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa
Tapahtuma	International Conference on Low Temperature Physics - Orlando, Yhdysvallat Kesto: 10 elok. 2005 → 17 elok. 2005 Konferenssinumero: 24

Julkaisusarja

Nimi	AIP conference proceedings
Kustantaja	AIP
Numero	1
Vuosikerta	850
ISSN (painettu)	0094-243X

Conference

Conference	International Conference on Low Temperature Physics
Lyhennettä	LT
Maa/Alue	Yhdysvallat
Kaupunki	Orlando
Ajanjakso	10/08/2005 → 17/08/2005

Tutkimusalat

carbon nanotubes
mirowave frequency
shot noise

Pääsy asiakirjaan

10.1063/1.2355263

Siteeraa tätä

Wu, F., Roschier, L., Tsuneta, T., Paalanen, M., Wang, T., & Hakonen, P. (2006). Setup for shot noise measurements in carbon nanotubes. teoksessa Y. E. A. Takana (Toimittaja), 24th International Conference on Low Temperature Physics, Orlando, Florida, USA, August 10-17.2005 (Sivut 1482-1483). (AIP conference proceedings; Vuosikerta 850, Nro 1). American Institute of Physics. https://doi.org/10.1063/1.2355263

@inproceedings{535b4ef93367456da8e179507e57fee1,

title = "Setup for shot noise measurements in carbon nanotubes",

abstract = "We have constructed a noise measurement setup for high impedance carbon nanotube samples. Our setup, working in the frequency range of 600 – 900 MHz, takes advantage of the fact that the shot noise power is reasonably large for high impedance sources so that relatively large, fixed non‐matching conditions can be tolerated.",

keywords = "carbon nanotubes, mirowave frequency, shot noise, carbon nanotubes, mirowave frequency, shot noise, carbon nanotubes, mirowave frequency, shot noise",

author = "Fan Wu and Leif Roschier and Taku Tsuneta and Mikko Paalanen and Taihong Wang and Pertti Hakonen",

year = "2006",

doi = "10.1063/1.2355263",

language = "English",

isbn = "0-7354-0347-3",

series = "AIP conference proceedings",

publisher = "American Institute of Physics",

number = "1",

pages = "1482--1483",

editor = "Takana, \{Y. et al.\}",

booktitle = "24th International Conference on Low Temperature Physics, Orlando, Florida, USA, August 10-17.2005",

address = "United States",

note = "International Conference on Low Temperature Physics, LT ; Conference date: 10-08-2005 Through 17-08-2005",

}

Wu, F, Roschier, L, Tsuneta, T, Paalanen, M, Wang, T & Hakonen, P 2006, Setup for shot noise measurements in carbon nanotubes. julkaisussa YEA Takana (Toimittaja), 24th International Conference on Low Temperature Physics, Orlando, Florida, USA, August 10-17.2005. AIP conference proceedings, Nro 1, Vuosikerta 850, American Institute of Physics, Sivut 1482-1483, International Conference on Low Temperature Physics, Orlando, Florida, Yhdysvallat, 10/08/2005. https://doi.org/10.1063/1.2355263

Setup for shot noise measurements in carbon nanotubes. / Wu, Fan; Roschier, Leif; Tsuneta, Taku et al.
24th International Conference on Low Temperature Physics, Orlando, Florida, USA, August 10-17.2005. toim. / Y. et al. Takana. American Institute of Physics, 2006. s. 1482-1483 (AIP conference proceedings; Vuosikerta 850, Nro 1).

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Conference article in proceedings › Scientific › vertaisarvioitu

TY - GEN

T1 - Setup for shot noise measurements in carbon nanotubes

AU - Wu, Fan

AU - Roschier, Leif

AU - Tsuneta, Taku

AU - Paalanen, Mikko

AU - Wang, Taihong

AU - Hakonen, Pertti

N1 - Conference code: 24

PY - 2006

Y1 - 2006

N2 - We have constructed a noise measurement setup for high impedance carbon nanotube samples. Our setup, working in the frequency range of 600 – 900 MHz, takes advantage of the fact that the shot noise power is reasonably large for high impedance sources so that relatively large, fixed non‐matching conditions can be tolerated.

AB - We have constructed a noise measurement setup for high impedance carbon nanotube samples. Our setup, working in the frequency range of 600 – 900 MHz, takes advantage of the fact that the shot noise power is reasonably large for high impedance sources so that relatively large, fixed non‐matching conditions can be tolerated.

KW - carbon nanotubes

KW - mirowave frequency

KW - shot noise

KW - carbon nanotubes

KW - mirowave frequency

KW - shot noise

KW - carbon nanotubes

KW - mirowave frequency

KW - shot noise

U2 - 10.1063/1.2355263

DO - 10.1063/1.2355263

M3 - Conference article in proceedings

SN - 0-7354-0347-3

T3 - AIP conference proceedings

SP - 1482

EP - 1483

BT - 24th International Conference on Low Temperature Physics, Orlando, Florida, USA, August 10-17.2005

A2 - Takana, Y. et al.

PB - American Institute of Physics

T2 - International Conference on Low Temperature Physics

Y2 - 10 August 2005 through 17 August 2005

ER -

Setup for shot noise measurements in carbon nanotubes

Abstrakti

Julkaisusarja

Conference

Tutkimusalat

Pääsy asiakirjaan

Sormenjälki

Siteeraa tätä