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Quantum Process Tomography with Digital Twins of Error Matrices

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Tutkimustuotos: LehtiartikkeliArticleScientificvertaisarvioitu

3 Lataukset (Pure)

Abstrakti

Accurate and robust quantum process tomography (QPT) is crucial for verifying quantum gates and diagnosing implementation faults in experiments aimed at building universal quantum computers. However, the reliability of QPT protocols is often compromised by faulty probes, particularly state preparation and measurement (SPAM) errors, which introduce fundamental inconsistencies in traditional QPT algorithms. We propose and investigate enhanced QPT for multiqubit systems by integrating the error matrix in a digital twin of the identity process matrix, enabling statistical refinement of SPAM error learning and improving QPT precision. Through numerical simulations, we demonstrate that our approach enables highly accurate and faithful process characterization. We further validate our method experimentally in superconducting quantum processors, achieving at least an order-of-magnitude fidelity improvement over standard QPT. Our results provide a practical and precise method for assessing quantum gate fidelity and enhancing QPT on a given hardware.

AlkuperäiskieliEnglanti
Artikkeli230601
JulkaisuPhysical Review Letters
Vuosikerta135
Numero23
DOI - pysyväislinkit
TilaJulkaistu - 5 jouluk. 2025
OKM-julkaisutyyppiA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

Rahoitus

This work has received funding from the EU Flagship on Quantum Technology through HORIZON-CL4-2022-QUANTUM-01-SGA Project No. 101113946 OpenSuperQPlus100. The Chalmers team acknowledges financial support by the Knut and Alice Wallenberg through the Wallenberg Center for Quantum Technology (WACQT). A.F.K. is also supported by the Swedish Foundation for Strategic Research (Grants No. FFL21-0279 and No. FUS21-0063). The quantum chips used in this work were fabricated at Myfab Chalmers. The work by the Aalto researchers has been done under the Academy of Finland Centre of Excellence program (Project No. 352925). The Aalto team acknowledges the provision of facilities and technical support by the Aalto University at the national research infrastructure OtaNano Low Temperature Laboratory.

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