Quantitative modelling in scanning probe microscopy

A. S. Foster; W. A. Hofer; A. L. Shluger

doi:10.1016/S1359-0286(01)00025-0

Quantitative modelling in scanning probe microscopy

A. S. Foster^*, W. A. Hofer, A. L. Shluger

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Teknillisen fysiikan laitos

UCL

Tutkimustuotos: Lehtiartikkeli › Review Article › vertaisarvioitu

12 Sitaatiot (Scopus)

Abstrakti

Significant progress has been made in the theoretical modelling of scanning probe microscopy. The models available now are sufficiently refined to provide information not only about the surface, but also the probe tip, and the physical changes occurring during the scanning process. This has significantly improved the quantitative analysis of experimental and theoretical results. Scanning probe microscopes can now be reliably used to analyse events on the level of single atoms and single electrons.

Alkuperäiskieli	Englanti
Sivut	427-434
Sivumäärä	8
Julkaisu	CURRENT OPINION IN SOLID STATE AND MATERIALS SCIENCE
Vuosikerta	5
Numero	5
DOI - pysyväislinkit	https://doi.org/10.1016/S1359-0286(01)00025-0
Tila	Julkaistu - 2001
OKM-julkaisutyyppi	A2 Arvio tiedejulkaisuussa (artikkeli)

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10.1016/S1359-0286(01)00025-0

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title = "Quantitative modelling in scanning probe microscopy",

abstract = "Significant progress has been made in the theoretical modelling of scanning probe microscopy. The models available now are sufficiently refined to provide information not only about the surface, but also the probe tip, and the physical changes occurring during the scanning process. This has significantly improved the quantitative analysis of experimental and theoretical results. Scanning probe microscopes can now be reliably used to analyse events on the level of single atoms and single electrons.",

keywords = "Quantitative modelling, Scanning force microscopy, Scanning probe microscopy, Scanning tunneling microscopy",

author = "Foster, {A. S.} and Hofer, {W. A.} and Shluger, {A. L.}",

year = "2001",

doi = "10.1016/S1359-0286(01)00025-0",

language = "English",

volume = "5",

pages = "427--434",

journal = "CURRENT OPINION IN SOLID STATE AND MATERIALS SCIENCE",

issn = "1359-0286",

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TY - JOUR

T1 - Quantitative modelling in scanning probe microscopy

AU - Foster, A. S.

AU - Hofer, W. A.

AU - Shluger, A. L.

PY - 2001

Y1 - 2001

N2 - Significant progress has been made in the theoretical modelling of scanning probe microscopy. The models available now are sufficiently refined to provide information not only about the surface, but also the probe tip, and the physical changes occurring during the scanning process. This has significantly improved the quantitative analysis of experimental and theoretical results. Scanning probe microscopes can now be reliably used to analyse events on the level of single atoms and single electrons.

AB - Significant progress has been made in the theoretical modelling of scanning probe microscopy. The models available now are sufficiently refined to provide information not only about the surface, but also the probe tip, and the physical changes occurring during the scanning process. This has significantly improved the quantitative analysis of experimental and theoretical results. Scanning probe microscopes can now be reliably used to analyse events on the level of single atoms and single electrons.

KW - Quantitative modelling

KW - Scanning force microscopy

KW - Scanning probe microscopy

KW - Scanning tunneling microscopy

UR - http://www.scopus.com/inward/record.url?scp=0035194857&partnerID=8YFLogxK

U2 - 10.1016/S1359-0286(01)00025-0

DO - 10.1016/S1359-0286(01)00025-0

M3 - Review Article

AN - SCOPUS:0035194857

SN - 1359-0286

VL - 5

SP - 427

EP - 434

JO - CURRENT OPINION IN SOLID STATE AND MATERIALS SCIENCE

JF - CURRENT OPINION IN SOLID STATE AND MATERIALS SCIENCE

IS - 5

ER -

Quantitative modelling in scanning probe microscopy

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