Probing the longitudinal electric field of Bessel beams using second-harmonic generation from nano-objects

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Probing the longitudinal electric field of Bessel beams using second-harmonic generation from nano-objects. / Turquet, Léo; Kakko, Joona Pekko; Karvonen, Lasse; Jiang, Hua; Kauppinen, Esko; Lipsanen, Harri; Kauranen, Martti; Bautista, Godofredo.

julkaisussa: Journal of Optics, Vuosikerta 19, Nro 8, 084011, 01.08.2017, s. 1-6.

Tutkimustuotos: Lehtiartikkelivertaisarvioitu

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Turquet, Léo ; Kakko, Joona Pekko ; Karvonen, Lasse ; Jiang, Hua ; Kauppinen, Esko ; Lipsanen, Harri ; Kauranen, Martti ; Bautista, Godofredo. / Probing the longitudinal electric field of Bessel beams using second-harmonic generation from nano-objects. Julkaisussa: Journal of Optics. 2017 ; Vuosikerta 19, Nro 8. Sivut 1-6.

Bibtex - Lataa

@article{2a05a07fd1534900805f23f76608b532,
title = "Probing the longitudinal electric field of Bessel beams using second-harmonic generation from nano-objects",
abstract = "Non-diffractive Bessel beams are receiving significant interest in optical microscopy due to their remarkably large depth of field. For example, studies have shown the superiority of Bessel beams over Gaussian beams for volumetric imaging of three-dimensionally thick or extended samples. However, the vectorial aspects of the focal fields of Bessel beams are generally obscured when traditional methods are used to characterize their three-dimensional point-spread function in space, which contains contributions from all optical field components. Here, we show experimentally the three-dimensional spatial distribution and enhanced depth of field of the longitudinal electric field components of a focused linearly-polarized Bessel beam. This is done through second-harmonic generation from well-defined vertically-aligned gallium-arsenide nanowires, whose second-order response is primarily driven by the longitudinal fields at the beam focus.",
keywords = "Bessel beams, longitudinal electric field, nonlinear microscopy, second-harmonic generation, semiconductor nanowires",
author = "L{\'e}o Turquet and Kakko, {Joona Pekko} and Lasse Karvonen and Hua Jiang and Esko Kauppinen and Harri Lipsanen and Martti Kauranen and Godofredo Bautista",
year = "2017",
month = "8",
day = "1",
doi = "10.1088/2040-8986/aa7722",
language = "English",
volume = "19",
pages = "1--6",
journal = "Journal of Optics",
issn = "2040-8978",
number = "8",

}

RIS - Lataa

TY - JOUR

T1 - Probing the longitudinal electric field of Bessel beams using second-harmonic generation from nano-objects

AU - Turquet, Léo

AU - Kakko, Joona Pekko

AU - Karvonen, Lasse

AU - Jiang, Hua

AU - Kauppinen, Esko

AU - Lipsanen, Harri

AU - Kauranen, Martti

AU - Bautista, Godofredo

PY - 2017/8/1

Y1 - 2017/8/1

N2 - Non-diffractive Bessel beams are receiving significant interest in optical microscopy due to their remarkably large depth of field. For example, studies have shown the superiority of Bessel beams over Gaussian beams for volumetric imaging of three-dimensionally thick or extended samples. However, the vectorial aspects of the focal fields of Bessel beams are generally obscured when traditional methods are used to characterize their three-dimensional point-spread function in space, which contains contributions from all optical field components. Here, we show experimentally the three-dimensional spatial distribution and enhanced depth of field of the longitudinal electric field components of a focused linearly-polarized Bessel beam. This is done through second-harmonic generation from well-defined vertically-aligned gallium-arsenide nanowires, whose second-order response is primarily driven by the longitudinal fields at the beam focus.

AB - Non-diffractive Bessel beams are receiving significant interest in optical microscopy due to their remarkably large depth of field. For example, studies have shown the superiority of Bessel beams over Gaussian beams for volumetric imaging of three-dimensionally thick or extended samples. However, the vectorial aspects of the focal fields of Bessel beams are generally obscured when traditional methods are used to characterize their three-dimensional point-spread function in space, which contains contributions from all optical field components. Here, we show experimentally the three-dimensional spatial distribution and enhanced depth of field of the longitudinal electric field components of a focused linearly-polarized Bessel beam. This is done through second-harmonic generation from well-defined vertically-aligned gallium-arsenide nanowires, whose second-order response is primarily driven by the longitudinal fields at the beam focus.

KW - Bessel beams

KW - longitudinal electric field

KW - nonlinear microscopy

KW - second-harmonic generation

KW - semiconductor nanowires

UR - http://www.scopus.com/inward/record.url?scp=85026371390&partnerID=8YFLogxK

U2 - 10.1088/2040-8986/aa7722

DO - 10.1088/2040-8986/aa7722

M3 - Article

VL - 19

SP - 1

EP - 6

JO - Journal of Optics

JF - Journal of Optics

SN - 2040-8978

IS - 8

M1 - 084011

ER -

ID: 14580281