@conference{33400994155f4bf882aa15056e81a121,
title = "(poster) Detection of Nickel in Silicon by Recombination Lifetime Measurements",
keywords = "characterization, nickel, photoconductive decay, silicon, characterization, nickel, photoconductive decay, silicon, characterization, nickel, photoconductive decay, silicon",
author = "Hele Savin and Marko Yli-Koski and Antti Haarahiltunen and Heli Talvitie and Juha Sinkkonen",
year = "2007",
language = "English",
note = "Conference on Gettering and Defect Engineering in Semiconductor Technology, GADEST ; Conference date: 14-10-2007 Through 19-10-2007",
}