@techreport{b2d1aa5cc94241248a334c5adeebd94d,
title = "Positron lifetime beam for defect studies in thin epitaxial semiconductor structures",
keywords = "epilayers, instrumentation, positron spectroscopy, vacancies, epilayers, instrumentation, positron spectroscopy, vacancies, epilayers, instrumentation, positron spectroscopy, vacancies",
author = "A. Laakso and K. Saarinen and P. Hautoj{\"a}rvi",
year = "2001",
language = "English",
series = "21st International Conference on Defects in Semiconductors",
type = "WorkingPaper",
}