Portability analysis for weak memory models porthos: One tool for all models

Hernán Ponce-de-León*, Florian Furbach, Keijo Heljanko, Roland Meyer

*Tämän työn vastaava kirjoittaja

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussaConference article in proceedingsScientificvertaisarvioitu

10 Sitaatiot (Scopus)

Abstrakti

We present porthos, the first tool that discovers porting bugs in performance-critical code. porthos takes as input a program and the memory models of the source architecture for which the program has been developed and the target model to which it is ported. If the code is not portable, porthos finds a bug in the form of an unexpected execution — an execution that is consistent with the target but inconsistent with the source memory model. Technically, porthos implements a bounded model checking method that reduces the portability analysis problem to satisfiability modulo theories (SMT). There are two main problems in the reduction that we present novel and efficient solutions for. First, the formulation of the portability problem contains a quantifier alternation (consistent + inconsistent). We introduce a formula that encodes both in a single existential query. Second, the supported memory models (e.g., Power) contain recursive definitions. We compute the required least fixed point semantics for recursion (a problem that was left open in [48]) efficiently in SMT. Finally we present the first experimental analysis of portability from TSO to Power.

AlkuperäiskieliEnglanti
OtsikkoStatic Analysis - 24th International Symposium, SAS 2017, Proceedings
KustantajaSpringer
Sivut299-320
Sivumäärä22
ISBN (painettu)9783319667058
DOI - pysyväislinkit
TilaJulkaistu - 2017
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisussa
TapahtumaInternational Static Analysis Symposium - New York, Yhdysvallat
Kesto: 30 elok. 20171 syysk. 2017
Konferenssinumero: 24

Julkaisusarja

NimiLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Vuosikerta10422 LNCS
ISSN (painettu)03029743
ISSN (elektroninen)16113349

Conference

ConferenceInternational Static Analysis Symposium
LyhennettäSAS
Maa/AlueYhdysvallat
KaupunkiNew York
Ajanjakso30/08/201701/09/2017

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