Polarization-sensitive reconstruction of transient local THz fields at dielectric interfaces

Tutkimustuotos: Lehtiartikkelivertaisarvioitu

Tutkijat

  • Kay Waltar
  • Johannes Haase
  • Rui Pan
  • Torsten Golz
  • Pavel Kliuiev
  • Michael Weinl
  • Matthias Schreck
  • Sasa Bajt
  • Nikola Stojanovic
  • Jeroen A. van Bokhoven
  • Matthias Hengsberger
  • Jürg Osterwalder
  • Luca Castiglioni

Organisaatiot

  • Universitat Zurich
  • Paul Scherrer Institute
  • Deutsches Elektronen-Synchrotron
  • Universität Augsburg
  • Swiss Federal Institute of Technology Zurich

Kuvaus

Intense THz fields can be used to excite specific low-frequency modes in condensed matter or drive confined currents in nano-structured arrays, paving the way for a new class of optoelectronic devices. The long wavelength enables spatially confined field enhancement due to interaction with metallic structures and interference effects at dielectric interfaces. We use THz photoelectron streaking for the polarization-sensitive reconstruction of all electric field components at dielectric and metallic interfaces. This is realized in a THz/x-ray pump–probe experiment where x-ray emitted photoelectrons probe the effective THz field in close surface proximity. We observe distinct differences in the THz response of a nano-structured Pt thin film and a Pt(111) bulk crystal, in particular for the parallel field component. Simulations of the nanoscale spatial field modulation at metallic islands on the thin film provide design parameters for different sensitivity regimes with respect to local fields.

Yksityiskohdat

AlkuperäiskieliEnglanti
Sivut1431
Sivumäärä1436
JulkaisuOPTICA
Vuosikerta6
Numero11
TilaJulkaistu - 2019
OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu

ID: 39528595