Performance and Properties of Ultra-Thin Silicon Nitride X-ray Windows

Tutkimustuotos: Lehtiartikkelivertaisarvioitu

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Performance and Properties of Ultra-Thin Silicon Nitride X-ray Windows. / Törmä, Pekka T.; Kostamo, Jari; Sipilä, Heikki; Mattila, Marco; Kostamo, Pasi; Kostamo, Esa; Lipsanen, Harri; Laubis, Christian; Scholze, Frank; Nelms, Nick; Shortt, Brian; Bavdaz, Marcos.

julkaisussa: IEEE Transactions on Nuclear Science, Vuosikerta 61, Nro 1, 01.2014, s. 695-699.

Tutkimustuotos: Lehtiartikkelivertaisarvioitu

Harvard

Törmä, PT, Kostamo, J, Sipilä, H, Mattila, M, Kostamo, P, Kostamo, E, Lipsanen, H, Laubis, C, Scholze, F, Nelms, N, Shortt, B & Bavdaz, M 2014, 'Performance and Properties of Ultra-Thin Silicon Nitride X-ray Windows', IEEE Transactions on Nuclear Science, Vuosikerta. 61, Nro 1, Sivut 695-699. https://doi.org/10.1109/TNS.2014.2298434

APA

Törmä, P. T., Kostamo, J., Sipilä, H., Mattila, M., Kostamo, P., Kostamo, E., ... Bavdaz, M. (2014). Performance and Properties of Ultra-Thin Silicon Nitride X-ray Windows. IEEE Transactions on Nuclear Science, 61(1), 695-699. https://doi.org/10.1109/TNS.2014.2298434

Vancouver

Author

Törmä, Pekka T. ; Kostamo, Jari ; Sipilä, Heikki ; Mattila, Marco ; Kostamo, Pasi ; Kostamo, Esa ; Lipsanen, Harri ; Laubis, Christian ; Scholze, Frank ; Nelms, Nick ; Shortt, Brian ; Bavdaz, Marcos. / Performance and Properties of Ultra-Thin Silicon Nitride X-ray Windows. Julkaisussa: IEEE Transactions on Nuclear Science. 2014 ; Vuosikerta 61, Nro 1. Sivut 695-699.

Bibtex - Lataa

@article{d48e1e813cad4715816304c010b8625b,
title = "Performance and Properties of Ultra-Thin Silicon Nitride X-ray Windows",
author = "T{\"o}rm{\"a}, {Pekka T.} and Jari Kostamo and Heikki Sipil{\"a} and Marco Mattila and Pasi Kostamo and Esa Kostamo and Harri Lipsanen and Christian Laubis and Frank Scholze and Nick Nelms and Brian Shortt and Marcos Bavdaz",
year = "2014",
month = "1",
doi = "10.1109/TNS.2014.2298434",
language = "English",
volume = "61",
pages = "695--699",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers",
number = "1",

}

RIS - Lataa

TY - JOUR

T1 - Performance and Properties of Ultra-Thin Silicon Nitride X-ray Windows

AU - Törmä, Pekka T.

AU - Kostamo, Jari

AU - Sipilä, Heikki

AU - Mattila, Marco

AU - Kostamo, Pasi

AU - Kostamo, Esa

AU - Lipsanen, Harri

AU - Laubis, Christian

AU - Scholze, Frank

AU - Nelms, Nick

AU - Shortt, Brian

AU - Bavdaz, Marcos

PY - 2014/1

Y1 - 2014/1

UR - http://dx.doi.org/10.1109/TNS.2014.2298434

U2 - 10.1109/TNS.2014.2298434

DO - 10.1109/TNS.2014.2298434

M3 - Article

VL - 61

SP - 695

EP - 699

JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

SN - 0018-9499

IS - 1

ER -

ID: 824152