Pavir šiaus pasyvacijos įtakos pavieni ų GaAs nanovam zdeli ų elektrinėms savyb ėms tyrimas matuojant srov ės priklausomybę nue įtampos atominės mikroskopu

Tutkimustuotos: Lehtiartikkelivertaisarvioitu



  • Lappeenranta University of Technology
  • Russian Academy of Sciences, Ioffe Physical-Technical Institute
  • St. Petersburg National Research University of Information Technologies, Mechanics and Optics (ITMO)


Current–voltage (I–V) characteristics of vertical p-GaAs nanowires (NWs) covered by different surface passivation materials were experimentally measured by conductive atomic force microscopy (C-AFM). The obtained I–V curves for individual NWs with a diameter of 100 nm covered with AlGaAs, GaN, GaP or InP shell layers were compared to analyse the influence of surface passivation on the density of surface states and choose the most beneficial passivating material for technological applications. We have found the absence of a Schottky barrier between the golden catalytic cap on the top of a NW and the nanowire situated below and covered with an ultrathin GaP passivating layer. It was suggested that passivating material can arrange the heterostructure configuration with the GaAs NW near the Au cap. The latter mechanism was proposed to explain a strong energy barrier found in nanowires covered with InP passivation. AlGaAs passivation affected the forward threshold voltage of nanowires for NWs, which was measured simultaneously with the resistivity of each individual vertical structure from an array by means of AFM in the regime of measuring the I–V curves and onefold calculations. We made an attempt to develop the methodology of measurement and characterization of electric properties of passivated NWs.


Julkaisun otsikon käännösInfluence of surface passivation on electric properties of individual GaAs nanowires studied by current–voltage AFM measurements
AlkuperäiskieliEi tiedossa
TilaJulkaistu - 2016
OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu

ID: 6837693