(oral talk) Comparison of boron-oxygen and copper-related light-induced degradation in silicon

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Abstract › Scientific › vertaisarvioitu

Alkuperäiskieli	Englanti
Tila	Julkaistu - 2015
OKM-julkaisutyyppi	Ei sovellu
Tapahtuma	Conference on Gettering and Defect Engineering in Semiconductor Technology - Bad Staffelstein, Saksa Kesto: 20 syysk. 2015 → 25 syysk. 2015 Konferenssinumero: 16

Conference	Conference on Gettering and Defect Engineering in Semiconductor Technology
Lyhennettä	GADEST
Maa/Alue	Saksa
Kaupunki	Bad Staffelstein
Ajanjakso	20/09/2015 → 25/09/2015

Siteeraa tätä

@conference{7c5984fe4c4f4c009ce2d13def95dedc,

title = "(oral talk) Comparison of boron-oxygen and copper-related light-induced degradation in silicon",

author = "Jeanette Lindroos and Hele Savin",

year = "2015",

language = "English",

note = "Conference on Gettering and Defect Engineering in Semiconductor Technology , GADEST ; Conference date: 20-09-2015 Through 25-09-2015",

}