TY - JOUR
T1 - Optimization of Cuprous Oxides Thin Films to be used as Thermoelectric Touch Detectors
AU - Figueira, Joana
AU - Loureiro, Joana
AU - Marques, José
AU - Bianchi, Catarina
AU - Duarte, Paulo
AU - Ruoho, Mikko
AU - Tittonen, Ilkka
AU - Ferreira, Isabel
PY - 2017/2/22
Y1 - 2017/2/22
N2 - The electronic and optical properties of p-type copper oxides (CO) strongly depend on the production technique as it influences the obtained phases: cuprous oxide (Cu2O) or cupric oxide (CuO), the most common ones. Cu films deposited by thermal evaporation have been annealed in air atmosphere, with temperature between 225 and 375 °C and time between 1 and 4 h. The resultant CO films have been studied to understand the influence of processing parameters in the thermoelectric, electrical, optical, morphological, and structural properties. Films with a Cu2O single phase are formed when annealing at 225 °C, while CuO single phase films can be obtained at 375 °C. In between, both phases are obtained in proportions that depend on the film thickness and annealing time. The positive sign of the Seebeck coefficient (S), measured at room temperature (RT), confirms the p-type behavior of both oxides, showing values up to 1.2 mV·°C-1 and conductivity up to 2.9 (μm)-1. A simple detector using Cu2O have been fabricated and tested with fast finger touch events.
AB - The electronic and optical properties of p-type copper oxides (CO) strongly depend on the production technique as it influences the obtained phases: cuprous oxide (Cu2O) or cupric oxide (CuO), the most common ones. Cu films deposited by thermal evaporation have been annealed in air atmosphere, with temperature between 225 and 375 °C and time between 1 and 4 h. The resultant CO films have been studied to understand the influence of processing parameters in the thermoelectric, electrical, optical, morphological, and structural properties. Films with a Cu2O single phase are formed when annealing at 225 °C, while CuO single phase films can be obtained at 375 °C. In between, both phases are obtained in proportions that depend on the film thickness and annealing time. The positive sign of the Seebeck coefficient (S), measured at room temperature (RT), confirms the p-type behavior of both oxides, showing values up to 1.2 mV·°C-1 and conductivity up to 2.9 (μm)-1. A simple detector using Cu2O have been fabricated and tested with fast finger touch events.
KW - copper oxide
KW - postdeposition annealing
KW - Seebeck
KW - thermal evaporation
KW - thin films
UR - http://www.scopus.com/inward/record.url?scp=85013471821&partnerID=8YFLogxK
U2 - 10.1021/acsami.6b12753
DO - 10.1021/acsami.6b12753
M3 - Article
AN - SCOPUS:85013471821
SN - 1944-8244
VL - 9
SP - 6520
EP - 6529
JO - ACS Applied Materials and Interfaces
JF - ACS Applied Materials and Interfaces
IS - 7
ER -