Optical characterization of directly deposited graphene on a dielectric substrate

Tutkimustuotos: Lehtiartikkelivertaisarvioitu

Tutkijat

  • Tommi Kaplas
  • Lasse Karvonen
  • Sepehr Ahmadi
  • Babak Amirsolaimani
  • Soroush Mehravar
  • Nasser Peyghambarian
  • Khanh Kieu
  • Seppo Honkanen
  • Harri Lipsanen

  • Yuri Svirko

Organisaatiot

  • University of Eastern Finland
  • Technical University of Denmark
  • University of Arizona

Kuvaus

By using scanning multiphoton microscopy we compare the nonlinear optical properties of the directly deposited and transferred to the dielectric substrate graphene. The direct deposition of graphene on oxidized silicon wafer was done by utilizing sacrificial copper catalyst film. We demonstrate that the directly deposited graphene and bi-layered transferred graphene produce comparable third harmonic signals and have almost the same damage thresholds. Therefore, we believe directly deposited graphene is suitable for the use of e.g. nanofabricated optical setups. (C) 2016 Optical Society of America

Yksityiskohdat

AlkuperäiskieliEnglanti
Sivut2965-2970
Sivumäärä6
JulkaisuOptics Express
Vuosikerta24
Numero3
TilaJulkaistu - 8 helmikuuta 2016
OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu

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