Nonlinear microscopy using cylindrical vector beams: Applications to three-dimensional imaging of nanostructures

Godofredo Bautista*, Joona Pekko Kakko, Veer Dhaka, Xiaorun Zang, Lasse Karvonen, Hua Jiang, Esko Kauppinen, Harri Lipsanen, Martti Kauranen

*Tämän työn vastaava kirjoittaja

Tutkimustuotos: LehtiartikkeliArticleScientificvertaisarvioitu

10 Sitaatiot (Scopus)
63 Lataukset (Pure)

Abstrakti

The three-dimensional (3D) optical fields that arise from the focusing of cylindrical vector beams (CVB) with radial and azimuthal polarizations provide new sources of contrast for optical microscopy of nano-objects. So far, these demonstrations have been restricted to two-dimensional transversal scanning, i.e., along the focal plane of interest, or use of point-like objects, i.e., single molecules and nanoparticles. Here, we demonstrate the first application of CVBs for 3D imaging of 3D nano-objects. This technique is done by acquiring 3D image scans of the second-harmonic generation signal from vertically-aligned semiconductor nanowires, whose second-order response is primarily driven by the longitudinal electric field, i.e., the field component along the nanowire axis. Our technique provides a new way to study individual nano-objects in three dimensions through the unique combination of nonlinear microscopy and CVBs.

AlkuperäiskieliEnglanti
Sivut12463-12468
Sivumäärä6
JulkaisuOptics Express
Vuosikerta25
Numero11
DOI - pysyväislinkit
TilaJulkaistu - 29 toukokuuta 2017
OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu

Sormenjälki Sukella tutkimusaiheisiin 'Nonlinear microscopy using cylindrical vector beams: Applications to three-dimensional imaging of nanostructures'. Ne muodostavat yhdessä ainutlaatuisen sormenjäljen.

  • Laitteet

  • Siteeraa tätä