Nonlinear microscopy using cylindrical vector beams: Applications to three-dimensional imaging of nanostructures

Tutkimustuotos: Lehtiartikkelivertaisarvioitu

Standard

Nonlinear microscopy using cylindrical vector beams : Applications to three-dimensional imaging of nanostructures. / Bautista, Godofredo; Kakko, Joona Pekko; Dhaka, Veer; Zang, Xiaorun; Karvonen, Lasse; Jiang, Hua; Kauppinen, Esko; Lipsanen, Harri; Kauranen, Martti.

julkaisussa: Optics Express, Vuosikerta 25, Nro 11, 29.05.2017, s. 12463-12468.

Tutkimustuotos: Lehtiartikkelivertaisarvioitu

Harvard

APA

Vancouver

Author

Bautista, Godofredo ; Kakko, Joona Pekko ; Dhaka, Veer ; Zang, Xiaorun ; Karvonen, Lasse ; Jiang, Hua ; Kauppinen, Esko ; Lipsanen, Harri ; Kauranen, Martti. / Nonlinear microscopy using cylindrical vector beams : Applications to three-dimensional imaging of nanostructures. Julkaisussa: Optics Express. 2017 ; Vuosikerta 25, Nro 11. Sivut 12463-12468.

Bibtex - Lataa

@article{f8915ec8943748c7b434dfefb516d252,
title = "Nonlinear microscopy using cylindrical vector beams: Applications to three-dimensional imaging of nanostructures",
abstract = "The three-dimensional (3D) optical fields that arise from the focusing of cylindrical vector beams (CVB) with radial and azimuthal polarizations provide new sources of contrast for optical microscopy of nano-objects. So far, these demonstrations have been restricted to two-dimensional transversal scanning, i.e., along the focal plane of interest, or use of point-like objects, i.e., single molecules and nanoparticles. Here, we demonstrate the first application of CVBs for 3D imaging of 3D nano-objects. This technique is done by acquiring 3D image scans of the second-harmonic generation signal from vertically-aligned semiconductor nanowires, whose second-order response is primarily driven by the longitudinal electric field, i.e., the field component along the nanowire axis. Our technique provides a new way to study individual nano-objects in three dimensions through the unique combination of nonlinear microscopy and CVBs.",
author = "Godofredo Bautista and Kakko, {Joona Pekko} and Veer Dhaka and Xiaorun Zang and Lasse Karvonen and Hua Jiang and Esko Kauppinen and Harri Lipsanen and Martti Kauranen",
year = "2017",
month = "5",
day = "29",
doi = "10.1364/OE.25.012463",
language = "English",
volume = "25",
pages = "12463--12468",
journal = "Optics Express",
issn = "1094-4087",
number = "11",

}

RIS - Lataa

TY - JOUR

T1 - Nonlinear microscopy using cylindrical vector beams

T2 - Applications to three-dimensional imaging of nanostructures

AU - Bautista, Godofredo

AU - Kakko, Joona Pekko

AU - Dhaka, Veer

AU - Zang, Xiaorun

AU - Karvonen, Lasse

AU - Jiang, Hua

AU - Kauppinen, Esko

AU - Lipsanen, Harri

AU - Kauranen, Martti

PY - 2017/5/29

Y1 - 2017/5/29

N2 - The three-dimensional (3D) optical fields that arise from the focusing of cylindrical vector beams (CVB) with radial and azimuthal polarizations provide new sources of contrast for optical microscopy of nano-objects. So far, these demonstrations have been restricted to two-dimensional transversal scanning, i.e., along the focal plane of interest, or use of point-like objects, i.e., single molecules and nanoparticles. Here, we demonstrate the first application of CVBs for 3D imaging of 3D nano-objects. This technique is done by acquiring 3D image scans of the second-harmonic generation signal from vertically-aligned semiconductor nanowires, whose second-order response is primarily driven by the longitudinal electric field, i.e., the field component along the nanowire axis. Our technique provides a new way to study individual nano-objects in three dimensions through the unique combination of nonlinear microscopy and CVBs.

AB - The three-dimensional (3D) optical fields that arise from the focusing of cylindrical vector beams (CVB) with radial and azimuthal polarizations provide new sources of contrast for optical microscopy of nano-objects. So far, these demonstrations have been restricted to two-dimensional transversal scanning, i.e., along the focal plane of interest, or use of point-like objects, i.e., single molecules and nanoparticles. Here, we demonstrate the first application of CVBs for 3D imaging of 3D nano-objects. This technique is done by acquiring 3D image scans of the second-harmonic generation signal from vertically-aligned semiconductor nanowires, whose second-order response is primarily driven by the longitudinal electric field, i.e., the field component along the nanowire axis. Our technique provides a new way to study individual nano-objects in three dimensions through the unique combination of nonlinear microscopy and CVBs.

UR - http://www.scopus.com/inward/record.url?scp=85020040243&partnerID=8YFLogxK

U2 - 10.1364/OE.25.012463

DO - 10.1364/OE.25.012463

M3 - Article

VL - 25

SP - 12463

EP - 12468

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 11

ER -

ID: 13642573