Abstrakti
The method of measuring nanowires elastic modulus by scanning probe microscopy is presented. This method uses the measurement of nanowire bending profiles in the precise force control mode. The possibilities of the method are demonstrated by measuring the Young's modulus of thin tapered InP nanowires.
Alkuperäiskieli | Englanti |
---|---|
Artikkeli | 012006 |
Julkaisu | IOP Conference Series: Materials Science and Engineering |
Vuosikerta | 443 |
Numero | 1 |
DOI - pysyväislinkit | |
Tila | Julkaistu - 14 marrask. 2018 |
OKM-julkaisutyyppi | A4 Artikkeli konferenssijulkaisussa |
Tapahtuma | International Conference on Scanning Probe Microscopy - Ekaterinburg, Venäjä Kesto: 26 elok. 2018 → 29 elok. 2018 |