Josephson penetration depth in coplanar junctions based on 2D materials

Tianyi Li*, John C. Gallop, Ling Hao, Edward J. Romans

*Tämän työn vastaava kirjoittaja

Tutkimustuotos: LehtiartikkeliArticleScientificvertaisarvioitu

41 Lataukset (Pure)

Abstrakti

Josephson junctions and superconducting quantum interference devices with graphene or other 2D materials as the weak link between superconductors have become a hot topic of research in recent years, with respect to both fundamental physics and potential applications. We have previously reported ultrawide Josephson junctions (up to 80 μm wide) based on chemical-vapor-deposition graphene where the critical current was found to be uniformly distributed in the direction perpendicular to the current. In this paper, we demonstrate that the unusually large Josephson penetration depth λ J that this corresponds to is enabled by the unique geometric structure of Josephson junctions based on 2D materials. We derive a new expression for the Josephson penetration depth of such junctions and verify our assumptions by numerical simulations.

AlkuperäiskieliEnglanti
Artikkeli173901
Sivut1-7
JulkaisuJournal of Applied Physics
Vuosikerta126
Numero17
DOI - pysyväislinkit
TilaJulkaistu - 7 marraskuuta 2019
OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu

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