(invited talk) Quantitative copper and iron measurement in silicon using contactless recombination lifetime measurements

Hele Savin

(invited talk) Quantitative copper and iron measurement in silicon using contactless recombination lifetime measurements

Hele Savin

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Abstract › Scientific › vertaisarvioitu

Alkuperäiskieli	Englanti
Tila	Julkaistu - 2005
OKM-julkaisutyyppi	Ei sovellu
Tapahtuma	RD50 - Workshop on Radiation Hard Semiconductor Devices for Very High Luminosity Colliders - Helsinki, Suomi Kesto: 2 kesäk. 2005 → 4 kesäk. 2005 Konferenssinumero: 6

Workshop

Workshop	RD50 - Workshop on Radiation Hard Semiconductor Devices for Very High Luminosity Colliders
Lyhennettä	CERN RD50
Maa/Alue	Suomi
Kaupunki	Helsinki
Ajanjakso	02/06/2005 → 04/06/2005

Siteeraa tätä

@conference{854aee7a13ea42cb88f775f7f291aff2,

title = "(invited talk) Quantitative copper and iron measurement in silicon using contactless recombination lifetime measurements",

author = "Hele Savin",

year = "2005",

language = "English",

note = "RD50 - Workshop on Radiation Hard Semiconductor Devices for Very High Luminosity Colliders, CERN RD50 ; Conference date: 02-06-2005 Through 04-06-2005",

}

(invited talk) Quantitative copper and iron measurement in silicon using contactless recombination lifetime measurements. / Savin, Hele.
2005. Abstraktin lähde: RD50 - Workshop on Radiation Hard Semiconductor Devices for Very High Luminosity Colliders, Helsinki, Suomi.

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Abstract › Scientific › vertaisarvioitu