Interfacial void segregation of Cl in Cu-Sn micro-connects

Glenn Ross; Xiaoma Tao; Mikael Broas; Nikolai Mäntyoja; Vesa Vuorinen; Andreas Graff; Frank Altmann; Matthias Petzold; Mervi Paulasto-Kröckel

doi:10.1007/s13391-017-6304-5

Interfacial void segregation of Cl in Cu-Sn micro-connects

Glenn Ross, Xiaoma Tao, Mikael Broas, Nikolai Mäntyoja, Vesa Vuorinen, Andreas Graff, Frank Altmann, Matthias Petzold, Mervi Paulasto-Kröckel

Tutkimustuotos: Lehtiartikkeli › Article › Scientific › vertaisarvioitu

8 Sitaatiot (Scopus)

Abstrakti

A scanning transmission electron microscopy and an energy dispersive X-ray analysis of one non-annealed and one annealed sample (423 K for 4 hours) was performed. The results showed small and large voids appearing within the non-annealed and annealed samples respectively. In addition, chlorine segregated from the bulk into the voids. Ab initio calculations determined the formation energies for dilute solutions of chlorine and vacancies in Cu, Cu3Sn and Cu6Sn5. Results suggest that dilute solutions energetically favor vacancies, indicating a low chlorine solubility and a driving force for segregation.

Alkuperäiskieli	Englanti
Sivut	307-312
Sivumäärä	6
Julkaisu	Electronic Materials Letters
Vuosikerta	13
Numero	4
DOI - pysyväislinkit	https://doi.org/10.1007/s13391-017-6304-5
Tila	Julkaistu - 10 heinäk. 2017
OKM-julkaisutyyppi	A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

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10.1007/s13391-017-6304-5

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Repo, P. (Manager) & Rissanen, A. (Other)
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@article{7062229bc09e46f199773a70cea574f5,

title = "Interfacial void segregation of Cl in Cu-Sn micro-connects",

abstract = "A scanning transmission electron microscopy and an energy dispersive X-ray analysis of one non-annealed and one annealed sample (423 K for 4 hours) was performed. The results showed small and large voids appearing within the non-annealed and annealed samples respectively. In addition, chlorine segregated from the bulk into the voids. Ab initio calculations determined the formation energies for dilute solutions of chlorine and vacancies in Cu, Cu3Sn and Cu6Sn5. Results suggest that dilute solutions energetically favor vacancies, indicating a low chlorine solubility and a driving force for segregation.",

author = "Glenn Ross and Xiaoma Tao and Mikael Broas and Nikolai M{\"a}ntyoja and Vesa Vuorinen and Andreas Graff and Frank Altmann and Matthias Petzold and Mervi Paulasto-Kr{\"o}ckel",

year = "2017",

month = jul,

day = "10",

doi = "10.1007/s13391-017-6304-5",

language = "English",

volume = "13",

pages = "307--312",

journal = "Electronic Materials Letters",

issn = "2093-6788",

publisher = "Springer",

number = "4",

}

TY - JOUR

T1 - Interfacial void segregation of Cl in Cu-Sn micro-connects

AU - Ross, Glenn

AU - Tao, Xiaoma

AU - Broas, Mikael

AU - Mäntyoja, Nikolai

AU - Vuorinen, Vesa

AU - Graff, Andreas

AU - Altmann, Frank

AU - Petzold, Matthias

AU - Paulasto-Kröckel, Mervi

PY - 2017/7/10

Y1 - 2017/7/10

N2 - A scanning transmission electron microscopy and an energy dispersive X-ray analysis of one non-annealed and one annealed sample (423 K for 4 hours) was performed. The results showed small and large voids appearing within the non-annealed and annealed samples respectively. In addition, chlorine segregated from the bulk into the voids. Ab initio calculations determined the formation energies for dilute solutions of chlorine and vacancies in Cu, Cu3Sn and Cu6Sn5. Results suggest that dilute solutions energetically favor vacancies, indicating a low chlorine solubility and a driving force for segregation.

AB - A scanning transmission electron microscopy and an energy dispersive X-ray analysis of one non-annealed and one annealed sample (423 K for 4 hours) was performed. The results showed small and large voids appearing within the non-annealed and annealed samples respectively. In addition, chlorine segregated from the bulk into the voids. Ab initio calculations determined the formation energies for dilute solutions of chlorine and vacancies in Cu, Cu3Sn and Cu6Sn5. Results suggest that dilute solutions energetically favor vacancies, indicating a low chlorine solubility and a driving force for segregation.

U2 - 10.1007/s13391-017-6304-5

DO - 10.1007/s13391-017-6304-5

M3 - Article

SN - 2093-6788

VL - 13

SP - 307

EP - 312

JO - Electronic Materials Letters

JF - Electronic Materials Letters

IS - 4

ER -

Interfacial void segregation of Cl in Cu-Sn micro-connects

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