Abstrakti
We study the effect of Al doping on thermoelectric power factor of ZnO films grown using atomic layer deposition method. The overall doping level is tuned by either varying the precursor pulsing sequence or by varying the number of precursor pulses while keeping the sequence unchanged. We observe that commonly utilized doping approach when periodic dopant layers are densely packed results in reduced power factor. At the same time, we find that thermoelectric performance can be improved by clustering the dopants. In addition, the clustering was found to tune the preferred crystal orientation of the polycrystalline film.
Alkuperäiskieli | Englanti |
---|---|
Julkaisu | Applied Physics Letters |
Vuosikerta | 103 |
Numero | 20 |
DOI - pysyväislinkit | |
Tila | Julkaistu - 2013 |
OKM-julkaisutyyppi | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä |
Tutkimusalat
- atomic layer deposition
- carrier mobility
- charge carriers
- doping
- II -VI semiconductors
- lectrical resistivity
- thermoelectric effects
- thin film growth
- thin films
- zinc oxide films