Influence of aluminium doping on thermoelectric performance of atomic layer deposited ZnO thin films

Mikko Ruoho, Ville Pale, Mikhail Erdmanis, Ilkka Tittonen

Tutkimustuotos: LehtiartikkeliArticleScientificvertaisarvioitu

27 Sitaatiot (Scopus)

Abstrakti

We study the effect of Al doping on thermoelectric power factor of ZnO films grown using atomic layer deposition method. The overall doping level is tuned by either varying the precursor pulsing sequence or by varying the number of precursor pulses while keeping the sequence unchanged. We observe that commonly utilized doping approach when periodic dopant layers are densely packed results in reduced power factor. At the same time, we find that thermoelectric performance can be improved by clustering the dopants. In addition, the clustering was found to tune the preferred crystal orientation of the polycrystalline film.
AlkuperäiskieliEnglanti
JulkaisuApplied Physics Letters
Vuosikerta103
Numero20
DOI - pysyväislinkit
TilaJulkaistu - 2013
OKM-julkaisutyyppiA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

Tutkimusalat

  • atomic layer deposition
  • carrier mobility
  • charge carriers
  • doping
  • II -VI semiconductors
  • lectrical resistivity
  • thermoelectric effects
  • thin film growth
  • thin films
  • zinc oxide films

Sormenjälki

Sukella tutkimusaiheisiin 'Influence of aluminium doping on thermoelectric performance of atomic layer deposited ZnO thin films'. Ne muodostavat yhdessä ainutlaatuisen sormenjäljen.

Siteeraa tätä