@techreport{cf3fed62e9554c87b0856efe969c587e,
title = "In-situ characterization of the polypyrrole films by QCM and CER techniques",
keywords = "contact electric resistance method, film, polypyrrole, quartz crystal micro balance, contact electric resistance method, film, polypyrrole, quartz crystal micro balance, contact electric resistance method, film, polypyrrole, quartz crystal micro balance",
author = "V. Syritski and A. {\"O}pik and A. Talo and O. Fors{\'e}n",
year = "2000",
language = "English",
series = "ICSM '2000, International Conference on Science and Technology of Synthetic Metals, Bad Gastein, 15.-21.7.2000",
pages = "A 150204W",
type = "WorkingPaper",
}