Improved Methods for Development of High Reliability Electronics

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Conference article in proceedings › Scientific › vertaisarvioitu

Alkuperäiskieli	Englanti
Otsikko	2014 IEEE Aerospace Conference, Marck 1-8,2014Yellowstone conference center, Big Sky, Montana.
Julkaisupaikka	United States
Kustantaja	IEEE
Tila	Julkaistu - 2014
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Muut tiedostot ja linkit

@inproceedings{5182007bc29d4fe0afbb79887da18f52,

title = "Improved Methods for Development of High Reliability Electronics",

author = "Jue Li and Hongqun Dong and Vesa Vuorinen and Juha Karppinen and Mattila, \{Toni T.\} and Mervi Paulasto-Kr{\"o}ckel",

year = "2014",

language = "English",

booktitle = "2014 IEEE Aerospace Conference, Marck 1-8,2014Yellowstone conference center, Big Sky, Montana.",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - Improved Methods for Development of High Reliability Electronics

AU - Li, Jue

AU - Dong, Hongqun

AU - Vuorinen, Vesa

AU - Karppinen, Juha

AU - Mattila, Toni T.

AU - Paulasto-Kröckel, Mervi

PY - 2014

Y1 - 2014

UR - http://www.aeroconf.org/

M3 - Conference article in proceedings

BT - 2014 IEEE Aerospace Conference, Marck 1-8,2014Yellowstone conference center, Big Sky, Montana.

PB - IEEE

CY - United States

ER -