Hit/Miss POD With Model Assisted and Emulated Flaws

Tuomas Koskinen, Mikko Virkkunen

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussaConference contributionScientific

29 Lataukset (Pure)

Abstrakti

The determination of the reliability of an inspection is of high significance. In particular, it is important to determine what is the largest crack, which could conceivably be missed during the in-service inspection. This information is utilized in order to choose the most effective method for different situations. Probability of detection (POD) curves are used to quantify the inspection effectiveness. However, major obstruction for POD curves is the requirement for a lot of data points in order to give reliable estimates of the lower limit performance, rendering reliable POD curves highly expensive to produce.
In this study, POD curve is estimated using only few thermal fatigue cracks, which is insufficient to produce a POD curve alone. In the present study the idea is to emulate the amplitude response from the measured crack in a way that represents an amplitude response from a certain crack size and in addition CIVA simulation is used to produce amplitude response data from similar simulated cracks. Both amplitude responses are then in turn converted to a B-scan image for inspectors to evaluate whether there is a crack or not. Then a POD curve is generated from the achieved hit/miss data. The idea is to decrease the amount of needed real flaws and also to determine if an inspector can tell the difference between real, emulated and a simulated flaw.
AlkuperäiskieliEnglanti
Otsikko12th European Conference on Non-Destructive Testing (ECNDT 2018)
Sivumäärä8
ISBN (elektroninen)978-91-639-6217-2
TilaJulkaistu - 1 elokuuta 2018
OKM-julkaisutyyppiB3 Ei-soviteltu artikkeli konferenssin julkaisusarjassa
TapahtumaEuropean Conference on Non-Destructive Testing - Gothenburg, Ruotsi
Kesto: 11 kesäkuuta 201815 kesäkuuta 2018
Konferenssinumero: 12

Julkaisusarja

NimiThe e-Journal of Nondestructive Testing
KustantajaNDT.net
Numero8
Vuosikerta23
ISSN (elektroninen)1435-4934

Conference

ConferenceEuropean Conference on Non-Destructive Testing
LyhennettäECNDT 2018
MaaRuotsi
KaupunkiGothenburg
Ajanjakso11/06/201815/06/2018

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  • Siteeraa tätä

    Koskinen, T., & Virkkunen, M. (2018). Hit/Miss POD With Model Assisted and Emulated Flaws. teoksessa 12th European Conference on Non-Destructive Testing (ECNDT 2018) (The e-Journal of Nondestructive Testing; Vuosikerta 23, Nro 8).