Harnessing Biased Faults in Attacks on ECC-based Signature Schemes

Kimmo Järvinen, Celine Blondeau, Dan Page, Michael Tunstall

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Conference article in proceedings › Scientific › vertaisarvioitu

9 Sitaatiot (Scopus)

Alkuperäiskieli	Englanti
Otsikko	FDTC 9th Workshop on Fault Diagnosis and Tolerance in Cryptography, (FDTC 2012) FDTC, Leuven, Belgium, September 9, 2012
Kustantaja	IEEE
Sivut	72-82
ISBN (painettu)	978-0-7695-4843-0
DOI - pysyväislinkit	https://doi.org/10.1109/FDTC.2012.13
Tila	Julkaistu - 2012
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Pääsy asiakirjaan

@inproceedings{759d07426e3f4f5297c7b95b27353890,

title = "Harnessing Biased Faults in Attacks on ECC-based Signature Schemes",

author = "Kimmo J{\"a}rvinen and Celine Blondeau and Dan Page and Michael Tunstall",

note = "VK: crypto",

year = "2012",

doi = "10.1109/FDTC.2012.13",

language = "English",

isbn = "978-0-7695-4843-0",

pages = "72--82",

booktitle = "FDTC 9th Workshop on Fault Diagnosis and Tolerance in Cryptography, (FDTC 2012) FDTC, Leuven, Belgium, September 9, 2012",

publisher = "IEEE",

address = "United States",

}

Harnessing Biased Faults in Attacks on ECC-based Signature Schemes. / Järvinen, Kimmo; Blondeau, Celine; Page, Dan et al.
FDTC 9th Workshop on Fault Diagnosis and Tolerance in Cryptography, (FDTC 2012) FDTC, Leuven, Belgium, September 9, 2012. IEEE, 2012. s. 72-82.

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Conference article in proceedings › Scientific › vertaisarvioitu

TY - GEN

T1 - Harnessing Biased Faults in Attacks on ECC-based Signature Schemes

AU - Järvinen, Kimmo

AU - Blondeau, Celine

AU - Page, Dan

AU - Tunstall, Michael

N1 - VK: crypto

PY - 2012

Y1 - 2012

UR - http://dx.doi.org/10.1109/FDTC.2012.13

U2 - 10.1109/FDTC.2012.13

DO - 10.1109/FDTC.2012.13

M3 - Conference article in proceedings

SN - 978-0-7695-4843-0

SP - 72

EP - 82

BT - FDTC 9th Workshop on Fault Diagnosis and Tolerance in Cryptography, (FDTC 2012) FDTC, Leuven, Belgium, September 9, 2012

PB - IEEE

ER -