Grazing incidence X-ray topography on semiconductor growth faces

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Chapter › Scientific › vertaisarvioitu

Alkuperäiskieli	Englanti
Otsikko	HASYLAB-DESY Annual Report 1995
Sivut	695-696
Tila	Julkaistu - 1996
OKM-julkaisutyyppi	A3 Kirjan tai muun kokoomateoksen osa

Tutkimusalat

@inbook{e1b23881db034d0192938cd65d01918a,

title = "Grazing incidence X-ray topography on semiconductor growth faces",

keywords = "optoelectronics, semiconductors, optoelectronics, semiconductors, optoelectronics, semiconductors",

author = "A. Danilewsky and J. Bibus and B. Schropp and P. McNally and J. Curley and T. Tuomi and M. Taskinen",

year = "1996",

language = "English",

pages = "695--696",

booktitle = "HASYLAB-DESY Annual Report 1995",

}

TY - CHAP

T1 - Grazing incidence X-ray topography on semiconductor growth faces

AU - Danilewsky, A.

AU - Bibus, J.

AU - Schropp, B.

AU - McNally, P.

AU - Curley, J.

AU - Tuomi, T.

AU - Taskinen, M.

PY - 1996

Y1 - 1996

KW - optoelectronics

KW - semiconductors

KW - optoelectronics

KW - semiconductors

KW - optoelectronics

KW - semiconductors

M3 - Chapter

SP - 695

EP - 696

BT - HASYLAB-DESY Annual Report 1995

ER -