Examination of the structural and optical failure of ultra bright LEDs under varying degrees of electrical stress using synchrotron x-ray topography and optical emission spectroscopy

D. Lowney; P.J. McNally; M. O´Hare; P.A.F. Herbert; T. Tuomi; R. Rantamäki; M. Karilahti; A.N. Danilewsky

Examination of the structural and optical failure of ultra bright LEDs under varying degrees of electrical stress using synchrotron x-ray topography and optical emission spectroscopy

D. Lowney, P.J. McNally, M. O´Hare, P.A.F. Herbert, T. Tuomi, R. Rantamäki, M. Karilahti, A.N. Danilewsky

Tutkimustuotos: Lehtiartikkeli › Article › Scientific › vertaisarvioitu

Alkuperäiskieli	Englanti
Sivut	249-253
Julkaisu	Journal of Materials Science: Materials in Electronics
Vuosikerta	12
Tila	Julkaistu - 2001
OKM-julkaisutyyppi	A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

Tutkimusalat

light emitting diodes
synchrotron topography

Siteeraa tätä

Lowney, D., McNally, P. J., O´Hare, M., Herbert, P. A. F., Tuomi, T., Rantamäki, R., Karilahti, M., & Danilewsky, A. N. (2001). Examination of the structural and optical failure of ultra bright LEDs under varying degrees of electrical stress using synchrotron x-ray topography and optical emission spectroscopy. Journal of Materials Science: Materials in Electronics, 12, 249-253.

@article{ab77220f16624427bcb058cc048288ce,

title = "Examination of the structural and optical failure of ultra bright LEDs under varying degrees of electrical stress using synchrotron x-ray topography and optical emission spectroscopy",

keywords = "light emitting diodes, synchrotron topography, light emitting diodes, synchrotron topography, light emitting diodes, synchrotron topography",

author = "D. Lowney and P.J. McNally and M. O´Hare and P.A.F. Herbert and T. Tuomi and R. Rantam{\"a}ki and M. Karilahti and A.N. Danilewsky",

year = "2001",

language = "English",

volume = "12",

pages = "249--253",

journal = "Journal of Materials Science: Materials in Electronics",

issn = "1573-482X",

publisher = "Springer",

}

Lowney, D, McNally, PJ, O´Hare, M, Herbert, PAF, Tuomi, T, Rantamäki, R, Karilahti, M & Danilewsky, AN 2001, 'Examination of the structural and optical failure of ultra bright LEDs under varying degrees of electrical stress using synchrotron x-ray topography and optical emission spectroscopy', Journal of Materials Science: Materials in Electronics, Vuosikerta 12, Sivut 249-253.

Examination of the structural and optical failure of ultra bright LEDs under varying degrees of electrical stress using synchrotron x-ray topography and optical emission spectroscopy. / Lowney, D.; McNally, P.J.; O´Hare, M. et al.
julkaisussa: Journal of Materials Science: Materials in Electronics, Vuosikerta 12, 2001, s. 249-253.

Tutkimustuotos: Lehtiartikkeli › Article › Scientific › vertaisarvioitu

TY - JOUR

T1 - Examination of the structural and optical failure of ultra bright LEDs under varying degrees of electrical stress using synchrotron x-ray topography and optical emission spectroscopy

AU - Lowney, D.

AU - McNally, P.J.

AU - O´Hare, M.

AU - Herbert, P.A.F.

AU - Tuomi, T.

AU - Rantamäki, R.

AU - Karilahti, M.

AU - Danilewsky, A.N.

PY - 2001

Y1 - 2001

KW - light emitting diodes

KW - synchrotron topography

KW - light emitting diodes

KW - synchrotron topography

KW - light emitting diodes

KW - synchrotron topography

M3 - Article

SN - 1573-482X

VL - 12

SP - 249

EP - 253

JO - Journal of Materials Science: Materials in Electronics

JF - Journal of Materials Science: Materials in Electronics

ER -