Evidence for charge collection efficiency recovery in heavily irradiated silicon detectors operated at cryogenic temperatures

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Conference article in proceedings › Scientific › vertaisarvioitu

Alkuperäiskieli	Englanti
Otsikko	1988 Nuclear Science Symposium and Medical Imaging Conference, Toronto, Canada,8.10.-14.10.1998
Sivut	s.1-3
Tila	Julkaistu - 1998
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa

Tutkimusalat

@inproceedings{d7c5cebcebd54c38beb310ff17026b06,

title = "Evidence for charge collection efficiency recovery in heavily irradiated silicon detectors operated at cryogenic temperatures",

keywords = "radiation damage, radiation damage, radiation damage",

author = "\{Da Vi{\'a}\}, C. and W. Bell and P. Berglund",

year = "1998",

language = "English",

pages = "s.1--3",

booktitle = "1988 Nuclear Science Symposium and Medical Imaging Conference, Toronto, Canada,8.10.-14.10.1998",

}

Evidence for charge collection efficiency recovery in heavily irradiated silicon detectors operated at cryogenic temperatures. / Da Viá, C.; Bell, W.; Berglund, P.
1988 Nuclear Science Symposium and Medical Imaging Conference, Toronto, Canada,8.10.-14.10.1998. 1998. s. s.1-3.

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Conference article in proceedings › Scientific › vertaisarvioitu

TY - GEN

T1 - Evidence for charge collection efficiency recovery in heavily irradiated silicon detectors operated at cryogenic temperatures

AU - Da Viá, C.

AU - Bell, W.

AU - Berglund, P.

PY - 1998

Y1 - 1998

KW - radiation damage

M3 - Conference article in proceedings

SP - s.1-3

BT - 1988 Nuclear Science Symposium and Medical Imaging Conference, Toronto, Canada,8.10.-14.10.1998

ER -