Abstrakti
The so-called generalized reflection law defines the fields reflected from non-uniform boundaries in terms of the local reflection coefficient. Absolute majority of researchers utilize the approximation of so-called reflection locality in which the reflection coefficient at a given point (at the reference unit cell position) is assumed to be the same as if the metasurface were uniform, i.e., all the unit cells surrounding the reference one were identical. It is known that this locally periodic approximation is adequate for anomalous reflectors in case of small deviations from the usual reflection law. In this talk we will present a proof that this approximation is adequate also for strongly anomalous reflections if (and only if) the reflection coefficient of the corresponding uniform metasurfaces is independent from the incidence angle.
Alkuperäiskieli | Englanti |
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Otsikko | 17th International Congress on Artificial Materials for Novel Wave Phenomena, Metamaterials 2023 |
Kustantaja | IEEE |
Sivut | 350-352 |
Sivumäärä | 3 |
ISBN (elektroninen) | 979-8-3503-3244-5 |
DOI - pysyväislinkit | |
Tila | Julkaistu - 2023 |
OKM-julkaisutyyppi | A4 Artikkeli konferenssijulkaisussa |
Tapahtuma | International Congress on Artificial Materials for Novel Wave Phenomena - Crete, Chania, Kreikka Kesto: 11 syysk. 2023 → 16 syysk. 2023 Konferenssinumero: 17 https://congress2023.metamorphose-vi.org/ |
Julkaisusarja
Nimi | International congress on advanced electromagnetic materials in microwaves and optics |
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ISSN (elektroninen) | 2573-2706 |
Conference
Conference | International Congress on Artificial Materials for Novel Wave Phenomena |
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Lyhennettä | Metamaterials |
Maa/Alue | Kreikka |
Kaupunki | Chania |
Ajanjakso | 11/09/2023 → 16/09/2023 |
Muu | Conference number 193986 |
www-osoite |
Sormenjälki
Sukella tutkimusaiheisiin 'Equivalence of Angular Stability and Reflection Locality for Metasurfaces with Anomalous Reflection'. Ne muodostavat yhdessä ainutlaatuisen sormenjäljen.Laitteet
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Aalto Electronics-ICT
Ryynänen, J. (Manager)
Elektroniikan ja nanotekniikan laitosLaitteistot/tilat: Facility