Electron counting in a silicon single-electron pump

Tuomo Tanttu, Alessandro Rossi, Kuan Yen Tan, Kukka-Emilia Huhtinen, Kok Wai Chan, Mikko Möttönen, Andrew S. Dzurak

Tutkimustuotos: LehtiartikkeliArticleScientificvertaisarvioitu

9 Sitaatiot (Scopus)
100 Lataukset (Pure)

Abstrakti

We report electron counting experiments in a silicon metal-oxide-semiconductor quantum dot architecture which has been previously demonstrated to generate a quantized current in excess of 80 pA with uncertainty below 30 parts per million. Single-shot detection of electrons pumped into a reservoir dot is performed using a capacitively coupled single-electron transistor. We extract the full probability distribution of the transfer of n electrons per pumping cycle for We find that the probabilities extracted from the counting experiment are in agreement with direct current measurements in a broad range of dc electrochemical potentials of the pump. The electron counting technique is also used to confirm the improving robustness of the pumping mechanism with increasing electrostatic confinement of the quantum dot.

AlkuperäiskieliEnglanti
Artikkeli103030
Sivumäärä6
JulkaisuNew Journal of Physics
Vuosikerta17
Numero10
DOI - pysyväislinkit
TilaJulkaistu - 16 lokakuuta 2015
OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu

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