Direct measurement of elastic modulus of InP nanowires with Scanning Probe Microscopy in PeakForce QNM mode

Tutkimustuotos: Lehtiartikkelivertaisarvioitu

Tutkijat

Organisaatiot

  • St. Petersburg National Research University of Information Technologies, Mechanics and Optics (ITMO)
  • Russian Academy of Sciences
  • Lappeenranta University of Technology

Kuvaus

In this manuscript, we present the study of elastic properties of InP nanowires with help of scanning probe microscope in advanced PeakForce Tapping® regime. The measuring method was developed in order to investigate the Young's modulus of these cone-shaped structures with significant accuracy. The difference in InP elasticity for wurtzite phase and zinc- blende phase was revealed. It was shown that elastic modulus of InP nanowires significantly increases from 60 GPa to more than 100 GPa when diameter of a nanowire is reduced below 50 nm. The core-shell model for InP nanowire was used for the explanation of this effect.

Yksityiskohdat

AlkuperäiskieliEnglanti
Artikkeli012029
Sivumäärä8
JulkaisuJournal of Physics: Conference Series
Vuosikerta769
Numero1
TilaJulkaistu - 23 marraskuuta 2016
OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu

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