Digital implementations for determination of temporal light artefacts of LED luminaires

V. Mantela; R. Nordlund; J. Askola; P. Kärhä; E. Ikonen

doi:10.1177/14771535231212404

Digital implementations for determination of temporal light artefacts of LED luminaires

V. Mantela^*, R. Nordlund, J. Askola, P. Kärhä, E. Ikonen

^*Tämän työn vastaava kirjoittaja

VTT Technical Research Centre of Finland Ltd.

Tutkimustuotos: Lehtiartikkeli › Article › Scientific › vertaisarvioitu

1 Sitaatiot (Scopus)

18 Lataukset (Pure)

Abstrakti

Flicker and stroboscopic effects caused by a temporally modulated light source may be harmful for the human visual system. Standardized measurement methods have been developed for the related temporal light artefacts of LED luminaires. It was found out that the performance of the International Electrotechnical Commission (IEC) recommended flickermeter implementation is highly dependent on sampling frequency. Novel digital implementations for the flickermeter and stroboscopic effect visibility measure (SVM) were created to remove any inaccuracies. The performance of the novel Aalto implementations does not depend on the sampling frequency when running the test waveforms of the IEC standard through the implementations. As compared with the IEC recommended digital implementations, Aalto flickermeter decreases the average error related to the test waveforms from −0.05 to +0.003, and Aalto SVM meter also decreases the average error by almost two orders of magnitude.

Alkuperäiskieli	Englanti
Sivumäärä	10
Julkaisu	Lighting Research and Technology
DOI - pysyväislinkit	https://doi.org/10.1177/14771535231212404
Tila	Sähköinen julkaisu (e-pub) ennen painettua julkistusta - 29 marrask. 2023
OKM-julkaisutyyppi	A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

Pääsy asiakirjaan

10.1177/14771535231212404Lisenssi: CC BY

mantela-et-al-2023-digital-implementations-for-determination-of-temporal-light-artefacts-of-led-luminairesFinal published version, 733 KBLisenssi: CC BY

Muut tiedostot ja linkit

Linkki julkaisuun Scopuksessa

Aalto-implementations-for-flickermeter-and-SVM-meter: v.3.0
Mantela, V. (Creator), Zenodo, 20 toukok. 2024
DOI - pysyväislinkki: 10.5281/zenodo.8380928, https://zenodo.org/records/11218813
Tietoaineisto: Ohjelmisto tai koodi

MetTLM (EMPIR): Metrology for temporal light modulation
Kärhä, P. (Vastuullinen tutkija), Mantela, V. (Projektin jäsen) & Rezazadeh, Y. (Projektin jäsen)
01/05/2021 → 30/04/2024
Projekti: EU other competitive funding (ERA-NET, EURAMET, EUREKA, EU JU)
PREIN: Fotoniikan Tutkimus ja Innovaatio
Mäkelä, K. (Vastuullinen tutkija)
01/01/2019 → 31/12/2022
Projekti: Academy of Finland: Other research funding

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@article{817f3efadb0d407a88cbb5f754b9279e,

title = "Digital implementations for determination of temporal light artefacts of LED luminaires",

abstract = "Flicker and stroboscopic effects caused by a temporally modulated light source may be harmful for the human visual system. Standardized measurement methods have been developed for the related temporal light artefacts of LED luminaires. It was found out that the performance of the International Electrotechnical Commission (IEC) recommended flickermeter implementation is highly dependent on sampling frequency. Novel digital implementations for the flickermeter and stroboscopic effect visibility measure (SVM) were created to remove any inaccuracies. The performance of the novel Aalto implementations does not depend on the sampling frequency when running the test waveforms of the IEC standard through the implementations. As compared with the IEC recommended digital implementations, Aalto flickermeter decreases the average error related to the test waveforms from −0.05 to +0.003, and Aalto SVM meter also decreases the average error by almost two orders of magnitude.",

author = "V. Mantela and R. Nordlund and J. Askola and P. K{\"a}rh{\"a} and E. Ikonen",

note = "Funding Information: The authors disclosed receipt of the following financial support for the research, authorship, and/or publication of this article: This work has been carried out in project 20NRM01 MetTLM that has received funding from the EMPIR program co-financed by the participating states and the European Union{\textquoteright}s Horizon 2020 research and innovation program. We also acknowledge support by the Academy of Finland Flagship Programme, Photonics Research and Innovation (PREIN), decision number: 320167. Funding Information: We would like to thank Carsten Dam-Hansen for pointing out the importance of accurate specification of the amplitude of the SVM test waveforms. This work has been carried out in project 20NRM01 MetTLM that has received funding from the EMPIR program co-financed by the participating states and the European Union{\textquoteright}s Horizon 2020 research and innovation program. We also acknowledge support by the Academy of Finland Flagship Programme, Photonics Research and Innovation (PREIN), decision number: 320167. Publisher Copyright: {\textcopyright} The Chartered Institution of Building Services Engineers 2023.",

year = "2023",

month = nov,

day = "29",

doi = "10.1177/14771535231212404",

language = "English",

journal = "Lighting Research and Technology",

issn = "1477-1535",

publisher = "SAGE Publications",

}

TY - JOUR

T1 - Digital implementations for determination of temporal light artefacts of LED luminaires

AU - Mantela, V.

AU - Nordlund, R.

AU - Askola, J.

AU - Kärhä, P.

AU - Ikonen, E.

N1 - Funding Information: The authors disclosed receipt of the following financial support for the research, authorship, and/or publication of this article: This work has been carried out in project 20NRM01 MetTLM that has received funding from the EMPIR program co-financed by the participating states and the European Union’s Horizon 2020 research and innovation program. We also acknowledge support by the Academy of Finland Flagship Programme, Photonics Research and Innovation (PREIN), decision number: 320167. Funding Information: We would like to thank Carsten Dam-Hansen for pointing out the importance of accurate specification of the amplitude of the SVM test waveforms. This work has been carried out in project 20NRM01 MetTLM that has received funding from the EMPIR program co-financed by the participating states and the European Union’s Horizon 2020 research and innovation program. We also acknowledge support by the Academy of Finland Flagship Programme, Photonics Research and Innovation (PREIN), decision number: 320167. Publisher Copyright: © The Chartered Institution of Building Services Engineers 2023.

PY - 2023/11/29

Y1 - 2023/11/29

N2 - Flicker and stroboscopic effects caused by a temporally modulated light source may be harmful for the human visual system. Standardized measurement methods have been developed for the related temporal light artefacts of LED luminaires. It was found out that the performance of the International Electrotechnical Commission (IEC) recommended flickermeter implementation is highly dependent on sampling frequency. Novel digital implementations for the flickermeter and stroboscopic effect visibility measure (SVM) were created to remove any inaccuracies. The performance of the novel Aalto implementations does not depend on the sampling frequency when running the test waveforms of the IEC standard through the implementations. As compared with the IEC recommended digital implementations, Aalto flickermeter decreases the average error related to the test waveforms from −0.05 to +0.003, and Aalto SVM meter also decreases the average error by almost two orders of magnitude.

AB - Flicker and stroboscopic effects caused by a temporally modulated light source may be harmful for the human visual system. Standardized measurement methods have been developed for the related temporal light artefacts of LED luminaires. It was found out that the performance of the International Electrotechnical Commission (IEC) recommended flickermeter implementation is highly dependent on sampling frequency. Novel digital implementations for the flickermeter and stroboscopic effect visibility measure (SVM) were created to remove any inaccuracies. The performance of the novel Aalto implementations does not depend on the sampling frequency when running the test waveforms of the IEC standard through the implementations. As compared with the IEC recommended digital implementations, Aalto flickermeter decreases the average error related to the test waveforms from −0.05 to +0.003, and Aalto SVM meter also decreases the average error by almost two orders of magnitude.

UR - http://www.scopus.com/inward/record.url?scp=85178470011&partnerID=8YFLogxK

U2 - 10.1177/14771535231212404

DO - 10.1177/14771535231212404

M3 - Article

AN - SCOPUS:85178470011

SN - 1477-1535

JO - Lighting Research and Technology

JF - Lighting Research and Technology

ER -

Digital implementations for determination of temporal light artefacts of LED luminaires

Abstrakti

Pääsy asiakirjaan

Muut tiedostot ja linkit

Sormenjälki

Tietoaineistot

Aalto-implementations-for-flickermeter-and-SVM-meter: v.3.0

Projektit

MetTLM (EMPIR): Metrology for temporal light modulation

PREIN: Fotoniikan Tutkimus ja Innovaatio

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