Digital calibration certificate in metrology

Tuukka Mustapää*, Thomas Wiedenhöfer, Clifford Brown, Raine Viitala, Pekka Nikander, Petri Kuosmanen

*Tämän työn vastaava kirjoittaja

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussaConference contributionScientificvertaisarvioitu

Abstrakti

The current practices regarding traceability and handling of metrological data are lacking definitive standards that would allow a higher level of digitalization. The traceability of metrological instruments is verified with calibration certificates that are currently either paper documents or pdf files. This means that many of the processes where metrological data, such as calibration data, are handled still require human operations. EMPIR project SmartCom aims to define an Extensible Markup Language (XML) based structure for machine readable and processable digital calibration certificates and establish a framework, which allows unambiguous and secure handling and transfer of metrological data in Internet of Things (IoT) and cloud applications. Establishing this framework requires changes in the current practices especially in the areas of authentication and data security. Due to the significance of these changes, a lot of co-operation between institutions, companies and authorities in the field of metrology will be needed for successful global standardization of digital transfer of metrological data.

AlkuperäiskieliEnglanti
OtsikkoProceedings of the 20th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2020
ToimittajatRichard K. Leach, David Billington, C. Nisbet, D. Phillips
Sivut349-350
Sivumäärä2
ISBN (elektroninen)9780995775176
TilaJulkaistu - kesäkuuta 2020
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisuussa
TapahtumaInternational Conference of the European Society for Precision Engineering and Nanotechnology - Virtual, Geneva, Itävalta
Kesto: 8 kesäkuuta 202012 kesäkuuta 2020
Konferenssinumero: 20

Julkaisusarja

NimiProceedings of the 20th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2020

Conference

ConferenceInternational Conference of the European Society for Precision Engineering and Nanotechnology
LyhennettäEUSPEN
MaaItävalta
KaupunkiGeneva
Ajanjakso08/06/202012/06/2020

Sormenjälki Sukella tutkimusaiheisiin 'Digital calibration certificate in metrology'. Ne muodostavat yhdessä ainutlaatuisen sormenjäljen.

Siteeraa tätä