Developing a Test Suite for Evaluating IEC 61499 Application Portability

Midhun Xavier; Tatiana Laikh; Sandeep Patil; Valeriy Vyatkin

doi:10.1109/ISIE51358.2023.10228154

Developing a Test Suite for Evaluating IEC 61499 Application Portability

Midhun Xavier^*, Tatiana Laikh, Sandeep Patil, Valeriy Vyatkin

^*Tämän työn vastaava kirjoittaja

Luleå University of Technology

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Conference article in proceedings › Scientific › vertaisarvioitu

1 Sitaatiot (Scopus)

Abstrakti

This paper presents the creation of a series of function blocks with the specific aim of testing the portability of IEC 61499 applications across diverse development and runtime environments. These function blocks have been developed to cover a wide range of test scenarios, including basic data types, functions, boundary conditions, and adapter features. The function blocks can be conveniently exported or imported through the use of XML files, thus facilitating seamless testing. By testing the runtime environment of different IEC 61499 systems, these function blocks help to identify and highlight any possible issues that may arise related to portability.

Alkuperäiskieli	Englanti
Otsikko	2023 IEEE 32nd International Symposium on Industrial Electronics, ISIE 2023 - Proceedings
Kustantaja	IEEE
Sivumäärä	4
ISBN (elektroninen)	979-8-3503-9971-4
DOI - pysyväislinkit	https://doi.org/10.1109/ISIE51358.2023.10228154
Tila	Julkaistu - 2023
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa
Tapahtuma	International Symposium on Industrial Electronics - Espoo, Suomi Kesto: 19 kesäk. 2023 → 21 kesäk. 2023 Konferenssinumero: 32

Julkaisusarja

Nimi	IEEE International Symposium on Industrial Electronics
Vuosikerta	2023-June
ISSN (elektroninen)	2163-5145

Conference

Conference	International Symposium on Industrial Electronics
Lyhennettä	ISIE
Maa/Alue	Suomi
Kaupunki	Espoo
Ajanjakso	19/06/2023 → 21/06/2023

Pääsy asiakirjaan

10.1109/ISIE51358.2023.10228154

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@inproceedings{08e958a85ec64a42be46e7574b79328f,

title = "Developing a Test Suite for Evaluating IEC 61499 Application Portability",

abstract = "This paper presents the creation of a series of function blocks with the specific aim of testing the portability of IEC 61499 applications across diverse development and runtime environments. These function blocks have been developed to cover a wide range of test scenarios, including basic data types, functions, boundary conditions, and adapter features. The function blocks can be conveniently exported or imported through the use of XML files, thus facilitating seamless testing. By testing the runtime environment of different IEC 61499 systems, these function blocks help to identify and highlight any possible issues that may arise related to portability.",

keywords = "IEC 61499, Industrial Control System, Portability, Testing",

author = "Midhun Xavier and Tatiana Laikh and Sandeep Patil and Valeriy Vyatkin",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; International Symposium on Industrial Electronics, ISIE ; Conference date: 19-06-2023 Through 21-06-2023",

year = "2023",

doi = "10.1109/ISIE51358.2023.10228154",

language = "English",

series = "IEEE International Symposium on Industrial Electronics",

publisher = "IEEE",

booktitle = "2023 IEEE 32nd International Symposium on Industrial Electronics, ISIE 2023 - Proceedings",

address = "United States",

}

Xavier, M, Laikh, T, Patil, S & Vyatkin, V 2023, Developing a Test Suite for Evaluating IEC 61499 Application Portability. julkaisussa 2023 IEEE 32nd International Symposium on Industrial Electronics, ISIE 2023 - Proceedings. IEEE International Symposium on Industrial Electronics, Vuosikerta 2023-June, IEEE, International Symposium on Industrial Electronics, Espoo, Suomi, 19/06/2023. https://doi.org/10.1109/ISIE51358.2023.10228154

Developing a Test Suite for Evaluating IEC 61499 Application Portability. / Xavier, Midhun; Laikh, Tatiana; Patil, Sandeep et al.
2023 IEEE 32nd International Symposium on Industrial Electronics, ISIE 2023 - Proceedings. IEEE, 2023. (IEEE International Symposium on Industrial Electronics; Vuosikerta 2023-June).

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Conference article in proceedings › Scientific › vertaisarvioitu

TY - GEN

T1 - Developing a Test Suite for Evaluating IEC 61499 Application Portability

AU - Xavier, Midhun

AU - Laikh, Tatiana

AU - Patil, Sandeep

AU - Vyatkin, Valeriy

N1 - Conference code: 32

PY - 2023

Y1 - 2023

N2 - This paper presents the creation of a series of function blocks with the specific aim of testing the portability of IEC 61499 applications across diverse development and runtime environments. These function blocks have been developed to cover a wide range of test scenarios, including basic data types, functions, boundary conditions, and adapter features. The function blocks can be conveniently exported or imported through the use of XML files, thus facilitating seamless testing. By testing the runtime environment of different IEC 61499 systems, these function blocks help to identify and highlight any possible issues that may arise related to portability.

AB - This paper presents the creation of a series of function blocks with the specific aim of testing the portability of IEC 61499 applications across diverse development and runtime environments. These function blocks have been developed to cover a wide range of test scenarios, including basic data types, functions, boundary conditions, and adapter features. The function blocks can be conveniently exported or imported through the use of XML files, thus facilitating seamless testing. By testing the runtime environment of different IEC 61499 systems, these function blocks help to identify and highlight any possible issues that may arise related to portability.

KW - IEC 61499

KW - Industrial Control System

KW - Portability

KW - Testing

UR - http://www.scopus.com/inward/record.url?scp=85172075037&partnerID=8YFLogxK

U2 - 10.1109/ISIE51358.2023.10228154

DO - 10.1109/ISIE51358.2023.10228154

M3 - Conference article in proceedings

AN - SCOPUS:85172075037

T3 - IEEE International Symposium on Industrial Electronics

BT - 2023 IEEE 32nd International Symposium on Industrial Electronics, ISIE 2023 - Proceedings

PB - IEEE

T2 - International Symposium on Industrial Electronics

Y2 - 19 June 2023 through 21 June 2023

ER -

Developing a Test Suite for Evaluating IEC 61499 Application Portability

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