@article{bb0e096b24664bf0ab57cf3aaa9827bd,
title = "Determination of crystal misorientation in epitaxial lateral overgrowth of GaN",
keywords = "epitaxial lateral overgrowth, gallium nitride, sapphire, synchrotrron x-ray topography, wing tilt, x-ray rocking curve, epitaxial lateral overgrowth, gallium nitride, sapphire, synchrotrron x-ray topography, wing tilt, x-ray rocking curve, epitaxial lateral overgrowth, gallium nitride, sapphire, synchrotrron x-ray topography, wing tilt, x-ray rocking curve",
author = "Weimin Chen and P.J. McNally and K. Jacobs and T. Tuomi and A.N. Danilewsky and Z.R. Zytkiewicz and D. Lowney and J. Kanatharana and L. Knuuttila and J. Riikonen",
year = "2002",
language = "English",
pages = "94--102",
journal = "Journal of Crystal Growth",
issn = "1873-5002",
publisher = "Elsevier",
number = "243",
}