Deformation of sapphire induced by a spherical indentation on the (1010) plane

R. Nowak, T. Sekino, S. Maruno, K. Niihara

Tutkimustuotos: LehtiartikkeliArticleScientificvertaisarvioitu

Abstrakti

This work clarifies the origin of the characteristic discontinuities registered during the deformation of the plane of sapphire, by means of depth sensing indentation experiments with a spherical indenter. The sudden increase of the plasticity of the crystal was found to be caused by a twinning process, The calculation and analysis of the distribution of resolved shear stresses under a spherical indenter predicted the features of the surface deformation. The high resolution microscopic examination of the residual impressions confirmed the theoretical prediction. (C) 1996 American Institute of Physics.

AlkuperäiskieliEnglanti
Sivut1063-1065
Sivumäärä3
JulkaisuApplied Physics Letters
Vuosikerta68
Numero8
DOI - pysyväislinkit
TilaJulkaistu - 1996
OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu

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