@article{821727b622e74a14ab2dd153ca2bde57,
title = "Defect evolution in 4H-SiC sublimation epi-layers grown on LPE buffers with reduced micropipe density",
keywords = "semiconductors, synchrotron X-ray topography, semiconductors, synchrotron X-ray topography, semiconductors, synchrotron X-ray topography",
author = "S. Hasen{\"o}hrl and R. Kudela and J. Novak and T.O. Tuomi and L. Knuuttila",
year = "2002",
language = "English",
pages = "00--00",
journal = "Materials Research Society Symposia Proceedings",
issn = "1946-4274",
publisher = "Springer",
number = "00",
}