Abstrakti
We discuss theoretically a setup where a time-dependent current consisting of a dc bias and two sinusoidal harmonics is driven through a sample. If the sample exhibits current-dependent shot noise, the down-converted noise power spectrum varies depending on the local-oscillator phase of the mixer. The theory of this phase-dependent noise is applied to discuss the measurement of the radio-frequency single-electron transistor. We also show that this effect can be used to measure the shot noise accurately even in nonlinear high-impedance samples.
Alkuperäiskieli | Englanti |
---|---|
Sivut | 5927-5929 |
Sivumäärä | 3 |
Julkaisu | Journal of Applied Physics |
Vuosikerta | 96 |
Numero | 10 |
DOI - pysyväislinkit | |
Tila | Julkaistu - 2004 |
OKM-julkaisutyyppi | A1 Julkaistu artikkeli, soviteltu |
Tutkimusalat
- mesoscopic measurement
- shot noise