Current variation in a rotor bar during transients due to a hot spot

Vicente Climente-Alarcon, Sabin Sathyan, Antero Arkkio, Jose A. Antonino-Daviu

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussaConference contributionScientificvertaisarvioitu

1 Sitaatiot (Scopus)

Abstrakti

This paper presents an initial study to provide further insight on the conditions under which a natural bar breakage was reproduced experimentally. With this aim several magnitudes at a rotor bar's narrowing (hot spot) in an induction motor during heavy transients: long startup and plug stopping, are calculated in order to compare it with the experimental data, which suggested that the bar breakage process can be modelled by thermal fatigue. A combined analytical electrical and thermal procedure is used to obtain the current and temperature distribution in the cage based on values previously computed by 2D electromagnetic FEM, whilst the temperature, resistance and final stresses at the defect are calculated by Finite Element Analysis. The results show that the asymmetric heating alters the current distribution in the cage throughout the transients and that the interbar currents play a fundamental role in the evolution of the defect.

AlkuperäiskieliEnglanti
OtsikkoIECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society
KustantajaIEEE
Sivut1246-1251
Sivumäärä6
ISBN (painettu)9781479917624
DOI - pysyväislinkit
TilaJulkaistu - 25 tammikuuta 2016
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisuussa
TapahtumaAnnual Conference of the IEEE Industrial Electronics Society - Yokohama, Japani
Kesto: 9 marraskuuta 201512 marraskuuta 2015
Konferenssinumero: 41

Conference

ConferenceAnnual Conference of the IEEE Industrial Electronics Society
LyhennettäIECON
MaaJapani
KaupunkiYokohama
Ajanjakso09/11/201512/11/2015

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  • Siteeraa tätä

    Climente-Alarcon, V., Sathyan, S., Arkkio, A., & Antonino-Daviu, J. A. (2016). Current variation in a rotor bar during transients due to a hot spot. teoksessa IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society (Sivut 1246-1251). [7392271] IEEE. https://doi.org/10.1109/IECON.2015.7392271